Copper and iron based thin film nanocomposites prepared by radio-frequency sputtering. Part II: elaboration and characterization of oxide/oxide thin film nanocomposites using controlled ex-situ oxidation process
Source abstract
Abstract
Copper and iron based thin films were prepared on glass substrate by radio-frequency sputtering technique from a delafossite CuFeO2 target. After deposition, the structure and microstructure of the films were examined using grazing incidence X-ray diffraction, Raman spectroscopy, electron probe micro-analysis and transmission electron microscopy coupled with EDS mapping. Target to substrate distance and sputtering gas pressure were varied to obtain films having different amount and distribution of copper nanoparticles and different composition of oxide matrix. The overall reaction process, which starts from CuFeO2 target and ends with the formation of films having different proportion of copper, copper oxide and iron oxide, was described by a combination of balanced chemical reactions. A direct relationship between the composition of the metal/oxide nanocomposite thin film and the sputtering parameters was established. This empirical relationship can further be used to control the composition of the metal/oxide nanocomposite thin films, i.e. the in situ reduction of copper ions in the target.
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Research context
OpenAlex topics: ZnO doping and properties · Copper-based nanomaterials and applications · Gas Sensing Nanomaterials and Sensors
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References (37)
Show source-provided references
1. Fernandez-Garcıa M, Martınez-Arias A, Hanson JC, Rodriguez JA (2004) Chem Rev 104:406310.1021/cr030032f ↗
2. Wei S, Wang Q, Zhu J, Sun L, Lin H, Guo Z (2011) Nanoscale 3:447410.1039/c1nr11000d ↗
3. Sanchez C, Rozes L, Ribot F, Laberty-Robert C, Grosso D, Sassoye C, Boissiere C, Nicole L (2010) C R Chimie 13:310.1016/j.crci.2009.06.001 ↗
4. Simon Q, Barreca D, Gasparotto A, Maccato C, Montini T, Gombac V, Fornasiero P, Lebedev OI, Turner S, Van Tendeloo G (2012) J Mater Chem 22:1173910.1039/c2jm31589k ↗
5. Ishihara T, Kometani K, Hasida M, Takita Y (1991) J Electrochem Soc 138:17310.1149/1.2085530 ↗
6. Barreca D, Comini E, Gasparotto E, Maccato C, Sadad C, Sberveglieri G, Tondello E (2009) Sens Actuators B 141:27010.1016/j.snb.2009.05.038 ↗
7. Kim YS, Hwang IS, Kim SJ, Lee CY, Lee JH (2008) Sens Actuators B 135:29810.1016/j.snb.2008.08.026 ↗
8. Ishihara T, Kometani K, Nishi Y, Takita Y (1995) Sens Actuator B 28:4910.1016/0925-4005(94)01539-T ↗
9. Haeusler A, Meyer JU (1996) Sens Actuators B 34:38810.1016/S0925-4005(96)01847-3 ↗
10. Xu JC, Hunter GW, Lukco D, Liu CC, Ward BJ (2009) IEEE Sens J 9:23510.1109/JSEN.2008.2011953 ↗
11. Chapelle A, Oudrhiri-Hassani F, Presmanes L, Barnabé A, Tailhades P (2010) Appl Surf Sci 256:471510.1016/j.apsusc.2010.02.079 ↗
12. Ishihara T, Higuchi M, Takagi T, Ito M, Nishiguchia M, Takita Y (1998) J Mater Chem 8:203710.1039/a801595c ↗
13. Barnabé A, Chapelle A, Presmanes L, Tailhades P (2012) J Mater Sci. doi: 10.1007/s10853-012-7123-610.1007/s10853-012-7123-6 ↗
14. Liao B, Wei Q, Wang K, Liu Y (2001) Sens Actuators B 80:20810.1016/S0925-4005(01)00892-9 ↗
15. O’Reilly M, Jiang X, Beechinor JT, Lynch S, Ni Dheasuna C, Patterson JC, Crean GM (1995) Appl Surf Sci 91:15210.1016/0169-4332(95)00111-5 ↗
16. Yakubi A, Tanaka S (2011) Mater Res Bull 46:232310.1016/j.materresbull.2011.08.043 ↗
17. Mugnier E, Barnabé A, Presmanes L, Tailhades P (2008) Thin Solid Films 516:145310.1016/j.tsf.2007.05.030 ↗
18. Prisedsky VV, Vinogradov VM (2004) J Solid State Chem 177:425810.1016/j.jssc.2004.07.058 ↗
19. Egger K, Feitknecht W (1962) Helv Chim Acta 65:2043
20. Tailhades P, Gillot B, Rousset A (1997) J Phys IV 7:249
21. Khvan AV, Fabrichnaya OB, Savinykh G, Adam R, Seifert HJ (2011) J Phase Equilib Diff 32:49810.1007/s11669-011-9951-5 ↗
22. Kenfack F, Langbein H (2004) Cryst Res Technol 39:107010.1002/crat.200410292 ↗
23. O’Keeffe M, Stone FS (1962) Roy Soc Lond 267:50110.1098/rspa.1962.0115 ↗
24. Li J, Mayer JW (1991) J Appl Phys 70:282010.1063/1.349344 ↗
25. Gong YS, Lee C, Yang CK (1995) J Appl Phys 77:542210.1063/1.359234 ↗
26. Wallbank B, Main IG, Johnson CE (1974) J Electron Spectrosc 5:25910.1016/0368-2048(74)85017-6 ↗
27. Kim KS (1974) J Electron Spectrosc 3:21710.1016/0368-2048(74)80012-5 ↗
28. Watts JF, Wolstenholme J (2003) An introduction to surface analysis by XPS and AES, Chapt 3.2.5. Wiley, London10.1002/0470867930 ↗
29. Pouchou JL, Pichoir F (1991) STRATAgem thin film analysis software and thickness determination. http://www.samx.com/microanalysis/products/stratagem_us.html
30. Benko F, Koffyberg F (1987) J Phys Chem Solids 48:43110.1016/0022-3697(87)90103-X ↗
31. Mugnier E, Pasquet I, Barnabé A, Presmanes L, Bonningue C, Tailhades P (2005) Thin Solid Films 493:4910.1016/j.tsf.2005.06.092 ↗
32. Rioult F, Pijolat M, Valdivieso F, Prin-Lamaze MA (2006) J Am Ceram Soc 89:99610.1111/j.1551-2916.2005.00898.x ↗
33. Sakai G, Matsunaga N, Shimanoe K, Yamazoe N (2001) Sens Actuators B 80:12510.1016/S0925-4005(01)00890-5 ↗
34. Baik NS, Sakai G, Shimanoe K, Miura N, Yamazoe N (2000) Sens Actuators B 65:9710.1016/S0925-4005(99)00403-7 ↗
35. Shimizu Y, Maekawa T, Nakamura Y, Egashira M (1998) Sens Actuators B 46:16310.1016/S0925-4005(97)00247-5 ↗
36. Seo MH, Yuasa M, Kida T, Huh JS, Shimanoe K, Yamazoe N (2009) Sens Actuators B 137:51310.1016/j.snb.2009.01.057 ↗
37. Mahajan RP, Patankar KK, Kothale MB, Patil SA (2000) Bull Mater Sci 23:27310.1007/BF02720082 ↗