Corrosion behavior of Cu–SiO2 nanocomposite coatings obtained by electrodeposition in the presence of cetyl trimethyl ammonium bromide
Source abstract
Abstract
Copper silica composite coatings are an attractive alternative to chromium and nickel coatings in order to avoid environmental problems and for application in electrical devices. However, co-deposition of SiO2 particles with metals occurs to a rather limited extent, generally under 1%, due to the hydrophilicity of SiO2, which makes the incorporation of particles in a metallic matrix difficult. To overcome this drawback, the influence of cetyl trimethyl ammonium bromide (CTAB) on the deposition and corrosion behavior of Cu–SiO2 coatings on steel has been studied. It was established that CTAB plays a beneficial role in SiO2 suspension stabilization, promotes the co-deposition of nanoparticles in the copper matrix and improves the deposit morphology and structure. Consequently, a higher corrosion resistance of Cu–SiO2 deposits obtained in the presence of CTAB was noticed. The most important effect was observed in the case when CTAB was used in concentration of 10−3 M in the electroplating bath.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Electrodeposition and Electroless Coatings · Corrosion Behavior and Inhibition · Copper Interconnects and Reliability
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (19)
Show source-provided references
1. Low CTJ, Wills RGA, Walsh FC (2006) Surf Coat Technol 201:37110.1016/j.surfcoat.2005.11.123 ↗
2. Fransaer JP, Leunis E, Hirato T, Celis JP (2002) J Appl Electrochem 32:12310.1023/A:1014738011603 ↗
3. Wang SC, Wei WCJ (2003) Mater Chem Phys 78:57410.1016/S0254-0584(01)00564-8 ↗
4. Fransaer J, Celis JP, Roos JR (1992) J Electrochem Soc 139:41310.1149/1.2069233 ↗
5. Bund A, Thiemig D (2007) J Appl Electrochem 37:34510.1007/s10800-006-9264-2 ↗
6. Chen YC, Ger MD, Hwu WH, Kuo SL, Hou KH (2002) J Chin Colloid Interface Soc 24:89
7. Helle K, Walsh F (1997) Trans Inst Met Finish 75:5310.1080/00202967.1997.11871143 ↗
8. Terzieva V, Fransaer J, Celis JP (2000) J Electrochem Soc 147:19810.1149/1.1393174 ↗
9. Ramasubramanian M, Popova SN, Popov BN, White RE, Yin KM (1996) J Electrochem Soc 143:216410.1149/1.1836976 ↗
10. Bryleva EY, Vodolazkaya NA, Mchedlov-Petrossyan NO, Samokhina LV, Matveevskaya NA, Tolmachev AV (2007) J Colloid Interface Sci 316:71210.1016/j.jcis.2007.07.036 ↗
11. Fransaer J, Celis JP (2001) Galvanotechnik 92:1544
12. Tuaweri TJ, Wilcox GD (2006) Surf Coat Technol 200:592110.1016/j.surfcoat.2005.09.023 ↗
13. Maa XK, Leea NH, Oha HJ, Kimb JW, Rheeb CK, Parka KS, Kim SJ (2010) Coll Surf A Physicochem Eng Aspects 358:17210.1016/j.colsurfa.2010.01.051 ↗
14. Fustes J, Gomes A, da Silva Pereira MI (2008) J Solid State Electrochem 12:143510.1007/s10008-007-0485-z ↗
15. Stern M, Geary AL (1957) J Electrochem Soc 104:5610.1149/1.2428496 ↗
16. Praveen BM, Venkatesha TV (2008) Appl Surf Sci 254:241810.1016/j.apsusc.2007.09.047 ↗
17. Trachli B, Keddam M, Shriri A, Takenouti H (2002) Corros Sci 44:99710.1016/S0010-938X(01)00124-X ↗
18. Youssef KMS, Koch CC, Fedkiw PS (2004) Corros Sci 46:5110.1016/S0010-938X(03)00142-2 ↗
19. Szczygieł B, Kołodziej M (2005) Electrochim Acta 50:418810.1016/j.electacta.2005.01.040 ↗