journal article·1976-05

Effect of grain-boundary scattering on the electrical resistivity of indium films

Arun K. Pal, S. Chaudhuri

Journal of Materials Science· Volume 11· Issue 5
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Abstract

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Research context

OpenAlex topics: Copper Interconnects and Reliability · Semiconductor materials and devices · Surface and Thin Film Phenomena

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References (12)

Show source-provided references
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