The equilibrium topography of sputtered amorphous solids
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Research context
OpenAlex topics: Ion-surface interactions and analysis · Surface Roughness and Optical Measurements · Thin-Film Transistor Technologies
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References (3)
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1. V. Marinkovic andB. Navinsek, Proc. 3rd European Regional Conf. on Electron Microscopy, Prague, 1964. pP. 311?12.
2. A. D. G. Stewart andM. W. Thompson,J. Materials Sci. 4 (1969) 56.10.1007/BF00555048 ↗
3. G. K. Wehner,J. Appl. Phys. 30 (1959) 1762.10.1063/1.1735051 ↗