DataVXACS Applied Electronic MaterialsPaper
journal article·2024-04-23

Critical Thickness of Yttrium Iron Garnet Thin Films with Epitaxial Interface to Get Perpendicular Magnetic Anisotropy

Zhao Ye, Hanbing Ling, Yu Ling, Qiuyun Fu

ACS Applied Electronic Materials· Volume 6· Issue 4
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Source abstract

Abstract

Minimizing the film thickness is the foundation to make devices smaller for practical applications. Here, we explore the critical thickness of yttrium iron garnet (YIG) films to obtain perpendicular magnetic anisotropy and analyze the mechanism behind. YIG film with robust perpendicular magnetic anisotropy and fine epitaxial interface is prepared. The effective field is as large as −1396 and −1758 Oe in 3.6 and 6 nm YIG films, respectively, indicating large perpendicular magnetic anisotropy in these two films. More importantly, the large strain-induced in-plane cubic magnetic anisotropy field of about 2068 Oe in 3 nm thick film is the main cause of the decay in perpendicular magnetic anisotropy. The YIG thickness at 3.6 nm is the minimum perpendicular in YIG films grown on YSGG substrates.
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Research context

OpenAlex topics: Magneto-Optical Properties and Applications · Magnetic properties of thin films · Multiferroics and related materials

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Engineering Research Center for Functional Ceramics of Ministry of Education, School of Integrated Circuits, Huazhong University of Science and Technology, Wuhan 430074, China

Wuhan National High Magnetic Field Center and School of Physics, Huazhong University of Science and Technology, Wuhan 430074, China

Shenzhen Huazhong University of Science and Technology Research Institute, Shenzhen 518000, P. R. China

Funding

National Key Research and Development Program of China · Shenzhen Technology Development Program · National Natural Science Foundation of China

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