Enhanced X-ray Imaging with Gd₂O₂S:Pr-Epoxy Composite Films: Synthesis, High-Resolution Performance, and Flexibility

Organic–inorganic composite scintillation films, recognized for their cost-efficiency and tunable scintillation characteristics, have been the subject of extensive research due to their considerable promise for use in X-ray flat panel imaging applications. This study presents a composite scintillation film utilizing Gd 2 O 2 S:Pr phosphors, traditional yet effective in this application. By optimizing the solid-state reaction process and employing acid pickling to eliminate impurities, we achieved Gd 2 O 2 S:Pr phosphors with pure phase and precise stoichiometric ratios. Subsequently, these phosphors were combined with epoxy resin to fabricate a composite scintillation film, which demonstrated excellent structural uniformity and flexibility. Furthermore, its imaging performance was evaluated under X-ray irradiation, revealing a resolution of 8 line pairs per millimeter. This outcome underscores the substantial promise of our films for advanced X-ray imaging applications, paving the way for future advancements in this domain.