Deformation patterns and fracture stress of beta-phase gallium oxide single crystal obtained using compression of micro-pillars
Source abstract
Abstract
The deformation of single-crystal beta-phase gallium oxide (or β-GaO) micro-pillars under compression was investigated with the aid of transmission electron microscopy. High-density stacking faults were the dominant deformation defects in the plastically deformed micro-pillars. Micro-cracks were found along (200), (001) and (010) lattice planes and fracture occurred along (200) lattice plane when compressive strain was sufficiently great. Lattice bending was also observed in the fractured pillar. The average fracture stress and strain of β-GaO being measured are 7.25 ± 1.11 GPa and 3.80 ± 0.57%, respectively, which have never been reported previously.
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Research context
OpenAlex topics: Ga2O3 and related materials · ZnO doping and properties · Electronic and Structural Properties of Oxides
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