Complex permittivity and electromagnetic interference shielding properties of Ti3SiC2/polyaniline composites
Source abstract
Abstract
Ti3SiC2/insulating polyaniline (Ti3SiC2/PANI) composites were prepared by solution blending and subsequently by hot-pressing process. The dielectric permittivity and electromagnetic interference (EMI) shielding effectiveness (SE) of the composites were determined in the frequency range of 8.2–12.4 GHz (X-band). Both real and imaginary permittivities increase with the increasing Ti3SiC2 content, and which are attributed to the enhanced displacement current and conduction current. The EMI SE of the composites can be greatly improved by addition of Ti3SiC2 filler, which may be ascribed to the increase of electrical conductivity of the composites. It is also found that the reflection of electromagnetic radiation is a dominant mechanism for EMI shielding of the composite. An average EMI SE of 23 dB can be achieved in the X-band range for the composite with 25 wt% Ti3SiC2 content, which shows the potential of the Ti3SiC2/PANI composites as EMI shielding materials for commercial applications.
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Research context
OpenAlex topics: MXene and MAX Phase Materials · Electromagnetic wave absorption materials · Full-Duplex Wireless Communications
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References (24)
Show source-provided references
1. Van Eck W (1985) Comput Secur 4:26910.1016/0167-4048(85)90046-X ↗
2. Ezquerra TA, Kremer F, Mohammadi M, Ruhe J, Wegner G, Wessling B (1989) Synth Met 28:8310.1016/0379-6779(89)90503-1 ↗
3. Das NC, Khastgir D, Chaki TK, Chakraborty A (2000) Compos Part A Appl Sci Manuf 31:106910.1016/S1359-835X(00)00064-6 ↗
4. Chandrasekhar P, Naishadham K (1999) Synth Met 105:11510.1016/S0379-6779(99)00085-5 ↗
5. Shinn ST, Fa YC (2001) Mater Sci Eng A 302:25810.1016/S0921-5093(00)01824-4 ↗
6. Jing XL, Wang YY, Zhang BY (2005) J Appl Polym Sci 98:214910.1002/app.22387 ↗
7. Kim MS, Kim HK, Byun SW, Jeong SH, Hong YK, Joo JS, Song KT, Kim JK, Lee CJ, Lee JY (2002) Synth Met 126:23310.1016/S0379-6779(01)00562-8 ↗
8. Yang YL, Gupta MC, Dudley KL, Lawrence RW (2005) Nano Lett 5:213110.1021/nl051375r ↗
9. Li Y, Chen CX, Zhang S, Ni YW, Huang J (2008) Appl Surf Sci 254:576610.1016/j.apsusc.2008.03.077 ↗
10. Das NC, Maiti S (2008) J Mater Sci 43:1920. doi: https://doi.org/10.1007/s10853-008-2458-810.1007/s10853-008-2458-8 ↗
11. Barsoum MW, El-Raghy T (1996) J Am Ceram Soc 79:195310.1111/j.1151-2916.1996.tb08018.x ↗
12. Low IM, Lee SK, Lawn BR, Barsoum MW (1998) J Am Ceram Soc 81:22510.1111/j.1151-2916.1998.tb02320.x ↗
13. Barsoum MW, El-Raghy T, Rawn CJ, Porter WD, Wang H, Payzant A, Hubbard C (1999) J Phys Chem Solid 60:42910.1016/S0022-3697(98)00313-8 ↗
14. Yoo HI, Barsoum MW, El-Raghy T (2000) Nature 407:58110.1038/35036686 ↗
15. Barsoum MW (2000) Prog Solid State Chem 28:20110.1016/S0079-6786(00)00006-6 ↗
16. Barsoum MW, Yoo HI, El-Raghy T, Polushina IK, Rud YuV (2000) Phys Rev B 62:1019410.1103/PhysRevB.62.10194 ↗
17. Shi SL, Pan W, Fang MH, Fang ZY (2005) Appl Phys Lett 87:17290210.1063/1.2117625 ↗
18. Shi SL, Pan W, Hang RB, Wan CL (2006) Appl Phys Lett 88:05290310.1063/1.2168684 ↗
19. Wu RF, Pan W, Shi SL, Han RB (2007) J Appl Phys 102:05610410.1063/1.2778226 ↗
20. Shi SL, Zhang LZ, Li JS (2008) J Appl Phys 103:12410310.1063/1.2942406 ↗
21. Sun ZM, Yang SL, Hashimoto H (2004) Ceram Int 30:187310.1016/j.ceramint.2003.12.052 ↗
22. Lagarkov AN, Sarychev AK (1996) Phys Rev B 53:631810.1103/PhysRevB.53.6318 ↗
23. Lee CY, Song HG, Jang KS, Oh EJ, Epstein AJ, Joo J (1999) Synth Met 102:134610.1016/S0379-6779(98)00234-3 ↗
24. Luo XC, Chung DDL (1999) Compos Part B Eng 30:22710.1016/S1359-8368(98)00065-1 ↗