In Situ Mapping of the Vectorial Electric Field within a Nanocrystal-Based Focal Plane Array Using Photoemission Microscopy
Source abstract
Abstract
Within a few years, nanocrystal-based infrared devices have achieved significant progress and advancements, including high-quality imaging systems. This raises the need to develop tools that can probe the active material of the device in situ and in operando to gain a deeper understanding of their operation beyond the overall response of the device. Here, we investigate a short-wave infrared imager based on HgTe nanocrystals with photoconductive operation, which now proposes imaging at wavelengths beyond the traditional InGaAs technology. We demonstrate that we can use photoemission microscopy to probe the energy landscape of this imaging array. Finally, we further use the high spatial resolution of the method to get access to the vectorial distribution of the electric field.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Quantum Dots Synthesis And Properties · Chalcogenide Semiconductor Thin Films · Nanowire Synthesis and Applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Sorbonne Université, CNRS, Institut des NanoSciences de Paris, INSP, F-75005 Paris, France
Synchrotron SOLEIL, L’Orme des Merisiers, Départementale 128, 91190 Saint-Aubin, France
New Imaging Technologies SA, 1 impasse de la Noisette, 91370 Verrières le Buisson, France
Funding
Agence Nationale de la Recherche · HORIZON EUROPE Marie Sklodowska-Curie Actions · Centre National de la Recherche Scientifique · H2020 European Research Council
References (41)
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