The AC electrical characterization of the solid-state reaction derived CaSnO3
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OpenAlex topics: Force Microscopy Techniques and Applications · Electronic and Structural Properties of Oxides · Ultrasonics and Acoustic Wave Propagation
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References (21)
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1. R. Buchanan, "Ceramic Materials for Electronics" (Marcel Dekker, New York 1986); A. J. MOULSON and J. M. HERBERT, "Electroceramics: Materials, Processing, Applications" (Chapman and Hall, New York, 1990).
2. Y. Shimizu, M. Shimabukuro, H. Arai and T. Seiyama, J. Electrochem. Soc. 136 (1989) 1206; P. T. MOSELEY, A. M. STONEHAM and D. E. WILLIAMS, in "Techniques and Mechanisms in Gas Sensing," edited by P. T. Moseley, J. O.W. Norris and D. E.Williams (Adam Hilger, Bristol, 1991) chap. 4.10.1149/1.2096854 ↗
3. U. Lumpe, J. Gerblinger and H. Meixner, Sensors and Actuators B 26–27 (1995) 97.10.1016/0925-4005(94)01565-Y ↗
4. J. M. Herbert, "Ceramic Dielectrics and Capacitors" (Gordon and Breach Science Publishers, Philadelphia, 1985).
5. A.-M. Azad, in Proc. 5th International Symposium on Advanced Materials, Islamabad, Pakistan, edited by M. A. Khan, A. Haq, K. Hussain and A. Q. Khan (Dr. A. Q. Khan Research Laboratories, Kahuta, Pakistan, 1997) pp. 110–117.
6. A.-M. Azad, L. L. W. Shyan and P. T. Yen, J. Alloys Comp. 282 (1999) 109.10.1016/S0925-8388(98)00808-1 ↗
7. A.-M. Azad and N. C. Hon, ibid. (1998) 270 (1998) 95.10.1016/S0925-8388(98)00370-3 ↗
8. O. Parkash, K. D. Mandal, C. C. Christopher, M. S. Sastry and D. Kumar, J. Mater. Sci. Lett. 13 (1994) 1616.10.1007/BF00704518 ↗
9. K. D. Mandal, M. S. Sastry and O. Parkash, ibid. 14 (1995) 1412.10.1007/BF00462200 ↗
10. S. Upadhyay, O. Parkash and D. Kumar, ibid. 16 (1997) 1330.10.1023/A:1018559932473 ↗
11. A.-M. Azad, L. B. Younkman, S. A. Akbar and M. A. Alim, J. Amer. Ceram. Soc. 77 (1994) 3145.10.1111/j.1151-2916.1994.tb04563.x ↗
12. V. D. Patton, C. C. Wang, S. A. Akbar and M. A. Alim, J. Appl. Phys. 78 (1995) 1757.10.1063/1.360205 ↗
13. M. A. Alim, Act. Pass. Electron. Comp. 19 (1996) 139.10.1155/1996/76148 ↗
14. M. A. Alim, M. A. Seitz and R. W. Hirthe, J. Appl. Phys. 63 (1988) 2337.10.1063/1.341176 ↗
15. M. A. Alim, S. Khanam and M. A. Seitz, Act. Pass. Electron. Comp. 16 (1994) 153.10.1155/1994/25820 ↗
16. M. A. Alim, Materials Research Society Proceedings: Electrically-Based Microstructural Characterization 411 (1996) 13.10.1557/PROC-411-13 ↗
17. A.-M. Azad, L. L. W. Shyan and M. A. Alim, J. Mater. Sci. 34 (1999) 3375.10.1023/A:1004633132169 ↗
18. M. A. Alim and S. A. Akbar, "Immittance Data Acquisition and Analytical Software Package," Developed at The Ohio State University, Columbus, OH, 1992.
19. M. A. Alim, Materials Research Society Proceedings: Electrically-Based Microstructural Characterization 411 (1996) 113.10.1557/PROC-411-113 ↗
20. L. C. Sletson, M. E. Potter and M. A. Alim, J. Amer. Ceram. Soc. 71 (1988) 909.10.1111/j.1151-2916.1988.tb07557.x ↗
21. M. A. Seitz, Int. J. Hybr. Microelectron. 3 (1980) 1.