journal article·2009-05

Phase field modeling of grain growth: effect of boundary thickness, triple junctions, misorientation, and anisotropy

I. M. McKenna, M. P. Gururajan, P. W. Voorhees

Journal of Materials Science· Volume 44· Issue 9
Publisher page

Abstract

Phase-field models based on multiple order parameters are used extensively to study grain growth in polycrystalline materials. However, if simulations are to be carried out using experimentally obtained microstructures as the initial condition, and the resultant microstructures are to be carefully compared with those obtained from experiments, then the parameters used in the numerical simulations need to be benchmarked with analytical solutions. Furthermore, the models themselves need to be modified to incorporate the dependence of grain boundary energy on misorientation across the boundary as well as the anisotropy in the boundary energy for any given misorientation that stems from the planes of different grains that make up the boundary. In this article, we address both these issues and present some preliminary results from our 2D and 3D simulations.
Source: openaire · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: Solidification and crystal growth phenomena · Aluminum Alloy Microstructure Properties · Metallurgy and Material Forming

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (27)

Show source-provided references
1. Gottstein G, Shvindlerman LS (1999) Grain boundary migration in metals: thermodynamics, kinetics, application. CRC Press, New York
2. Sutton AP, Balluffi RW (1997) Interfaces in crystalline materials. Oxford University Press, Oxford
3. Humphreys FJ, Hatherly M (2004) Recrystallization and related annealing phenomena, 2nd edn. Elsevier, New York
4. Fionova LK, Artemyev AV (1993) Grain boundaries in metals and semiconductors. de physique edition, Les Ulis Cedex
5. Kang S-KL (2005) Sintering: densification, grain growth and microstructure. Elsevier, New York
6. Moelans N, Blanpain B, Wollants P (2008) Phys Rev B 78(024113):1
7. von Neumann J (1952) Metal interfaces. American Society of Metals, Cleveland, p 65. A written note to the paper of C. S. Smith
8. Mullins WW (1956) J Appl Phys 27:90010.1063/1.1722511 ↗
9. MacPherson RD, Srolovitz DJ (2007) Nature 446:105310.1038/nature05745 ↗
10. Thornton K, Agren J, Voorhees PW (2003) Acta Mater 51:567510.1016/j.actamat.2003.08.008 ↗
11. Chen L-Q (2002) Annu Rev Mater Res 32:11310.1146/annurev.matsci.32.112001.132041 ↗
12. Gururajan MP, McKenna IM, Voorhees PW (2008) Manuscript in preparation
13. Chen LQ, Yang W (1994) Phys Rev B 50:1575210.1103/PhysRevB.50.15752 ↗
14. Chen L-Q, Wang Y (1996) J Mater 48(12):13
15. Abinandanan TA, Haider F (2001) Philos Mag A 81(10):245710.1080/01418610110038420 ↗
16. Fan D, Geng C, Chen L-Q (1997) Acta Mater 45(3):111510.1016/S1359-6454(96)00221-2 ↗
17. Fan D, Chen L-Q, Chen SP (1997) Mater Sci Eng A 238:7810.1016/S0921-5093(97)00437-1 ↗
18. McKenna IM, Gururajan MP, Voorhees PW (2008) Manuscript in preparation
19. Gruber J, Ma N, Wang Y, Rollett AD, Rohrer GS (2006) Model Simulat Mater Sci Eng 14:118910.1088/0965-0393/14/7/007 ↗
20. Vedantam S, Patnaik BSV (2006) Phys Rev E 73:110.1103/PhysRevE.73.016703 ↗
21. Kim SG, Kim DI, Kim WT, Park YB (2006) Phys Rev E 74(061605):1
22. Vanherpe L, Moelans N, Blanpain B, Vandewalle S (2007) Phys Rev E 76(056702):1
23. McKenna IM, Ma N, Gururajan MP, Wang Y, Voorhees PW (2008) Manuscript in preparation
24. Allen SM, Cahn JW (1979) Acta Metall 27:108510.1016/0001-6160(79)90196-2 ↗
25. Press WH, Teukolsky SA, Vetterling WT, Flannery BP (1992) Numerical recipes in Fortran, 2nd edn. Cambridge University Press, Cambridge
26. Fan D, Chen L-Q (1997) Philos Mag Lett 75(4):18710.1080/095008397179615 ↗
27. Cahn JW, Hilliard JE (1958) J Chem Phys 28(2):25810.1063/1.1744102 ↗