journal article·1969-04

Micro-indentation hardness variation as a function of composition for polycrystalline solutions in the systems PbS/PbTe, PbSe/PbTe, and PbS/PbSe

M. S. Darrow, W. B. White, R. Roy

Journal of Materials Science· Volume 4· Issue 4
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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Metal and Thin Film Mechanics · Chalcogenide Semiconductor Thin Films · Semiconductor materials and interfaces

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References (14)

Show source-provided references
1. M. S. Darrow, W. B. White, and R. Roy, Trans. Met. Soc. AIME 236 (1966) 654.
2. D. E. Grimes, ibid 233 (1965) 1442.
3. D. R. Simpson, Econ. Geol. 59 (1964) 150.10.2113/gsecongeo.59.1.150 ↗
4. H. D. Wright, W. M. Barnard, and J. B. Halbig, Amer. Mineral. 50 (1965) 1802.
5. B. W. Mott, ?Micro-indentation Hardness Testing? (Butterworths, London, 1956).
6. H. Bückle, Met. Rev. 4 (1959) 49.
7. B. B. Young and A. P. Millman, Trans. Inst. Min. Met. 73 (1963?1964) 437.
8. J. Bloem and F. A. Kroger, Nature 175 (1955) 861.10.1038/175861a0 ↗
9. M. S. Seltzer, J. Appl. Phys. 37 (1966) 4780.10.1063/1.1708137 ↗
10. N. D. Sindeyeva and A. A. Godovikov, Doklady Akad. Nauk SSSR 127 (1959) 431.
11. P. M. Bethke and P. B. Barton, US Geol. Survey Prof. Paper 114 (1961) B-266.
12. A. Smakula et al, Ann. Tech. Rept. to Advanced Research Projects Agency from Center for Materials Science, MIT (1966?67) p. 101.
13. I. I. Burdiyan, Fiz. Tverd. Tela 1 (1959) 1360.
14. A. M. Reti, A. K. Jena, and M. B. Bever, Tech. Rept. No. 4 to Office of Naval Research from Dept. of Metallurgy, MIT (1967).