Controlling preferred orientation of ZnO thin films by atomic layer deposition
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: ZnO doping and properties · Surface Roughness and Optical Measurements · Gas Sensing Nanomaterials and Sensors
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (8)
Show source-provided references
1. J. Hu and G. Gordon, J. Appl. Phys. 71 (1992) 880.10.1063/1.351309 ↗
2. F. S. Hickernell, IEEE Trans. Sonics Ultrason SU-32 (1980) 621.10.1109/T-SU.1985.31645 ↗
3. R. D. Gould, A. K. Hassan and F. S. Mahmood, Int. J. Electron. 76 (1994) 901.10.1080/00207219408925994 ↗
4. J. Muller and S. Weissenrieder, J. Anal. Chem. 349 (1994) 380.
5. Z. Y. Ning, S. H. Cheng, S. B. Ge, Y. Chao, Z. Q. Gang, Y. X. Zhang and Z. G. Liu, Thin Solid Films 307 (1997) 50.10.1016/S0040-6090(97)00303-9 ↗
6. V. Lujala, J. Skarp, M. Tammenmaa and T. Suntola, Appl. Surf. Sci. 82/83 (1994) 34.10.1016/0169-4332(94)90192-9 ↗
7. K. Kaiya, N. Yoshii, N. Takahashi and T. Nakamura, J. Mater. Sci. Lett. 19 (2000) 2089.10.1023/A:1026745903387 ↗
8. S. Chaisitsak, T. Sugiyama, A. Yamada and M. Konagai, Jpn. J. Appl. Phys. 38 (1999) 4989.10.1143/JJAP.38.4989 ↗