Microtopography of surfaces eroded by ion-bombardment
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Ion-surface interactions and analysis · Integrated Circuits and Semiconductor Failure Analysis · Electron and X-Ray Spectroscopy Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (10)
Show source-provided references
1. C. D. Moak, H. Reese, andW. M. Good,Nucleonics 9 (1951) 18.
2. A. D. G., Stewart, Proc. 5th Int. Conf. on Electron Microscopy (Philadelphia, 1962) (Academic Press, New York, 1962) paper D.12.
3. O. Almen andG. Bruce,Nucl. Inst. Meth. II (1961) 257, 279.10.1016/0029-554X(61)90026-X ↗
4. M. W. Thompson,Phil. Mag. 18 (1968) 152.
5. Idem, ?Defects and Radiation Damage in Metals? (Cambridge University Press, London, 1968).
6. G. K. Wehner,J. Appl. Phys. 30 (1959) 1762.10.1063/1.1735051 ↗
7. J. Fluit, Thesis (Leiden University, 1962).
8. D. Onderdelinden,Can. J. Phys. 46 (1967) 739.10.1139/p68-091 ↗
9. W. Gibson, private communication, 1967.
10. J. Lindhard,Matt. Fys. Medd. 34 (14) 1965.10.1080/05775132.1965.11469819 ↗