Characterization of nanocrystalline materials by X-ray line profile analysis
Source abstract
Abstract
X-ray line profile analysis is shown to be a powerful tool to characterize the microstructure of nanocrystalline materials in terms of grain and subgrain size, dislocation structure and dislocation densities and planar defects, especially stacking faults and twin boundaries. It is shown that the X-ray method can provide valuable complementary information about the microstructure, especially when combined with transmission electron microscopy and differential scanning calorimetry.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Microstructure and mechanical properties · X-ray Diffraction in Crystallography · Advanced materials and composites
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
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