journal article·2024-06-25

Spin–Orbit Torque Modulated by Interface Chemistry in Topological BiSb/NiFe Bilayers with Titanium Insertion

Talluri Manoj, Zhenchao Wen, Jun Uzuhashi, Tadakatsu Ohkubo, Hiroaki Sukegawa, Chandrasekhar Murapaka, Brian York, Xiaoyong Liu, Quang Le, Seiji Mitani

Publisher page

Abstract

Topological insulators are intriguing materials in the field of spintronics because they exhibit unique electronic properties that hold great promise for device applications. BiSb has attracted more research interest among topological materials due to its remarkably high spin–orbit torque (SOT) efficiency. However, due to the low melting point of the alloy, high diffusivities of Bi/Sb tend to degrade the SOT efficiency with temperature and aging. In this work, we utilize interfacial chemistry driven by a titanium (Ti) spacer between BiSb and NiFe bilayers to improve the SOT efficiency. We investigated the effect of the Ti insertion layer on the SOT efficiency under as-deposited, room-temperature aging, and annealing conditions. The SOT efficiency, estimated from the spin-torque ferromagnetic resonance response, revealed that the samples with the Ti layer had shown a multifold increase in the SOT efficiency compared to those without Ti insertion. Atomic resolution microstructural analyses provided a clear understanding of the interfacial chemistry where Ti successfully hindered the interdiffusion of Ni and Sb. The interfacial chemistry in the vicinity of Ti contributed significantly to the improvement of the SOT efficiency. These results highlight the importance of the Ti insertion layer in the BiSb-based topological material/ferromagnet bilayer systems for SOT applications in spintronics.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: Magnetic properties of thin films · Topological Materials and Phenomena · Quantum and electron transport phenomena

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

National Institute for Materials Science, Tsukuba 305-0047, Japan

Department of Materials Science and Metallurgical Engineering, Indian Institute of Technology, Hyderabad 502284, Telangana, India

Western Digital, San Jose, California 95119, United States

Funding

Indian Institute of Technology Hyderabad · Ministry of Education, India · NIMS Joint Center for materials Science · JICA Friendship 2.0

References (45)

Show source-provided references
1. 10.1126/science.116773310.1126/science.1167733 ↗
2. 10.1103/PhysRevLett.98.10680310.1103/PhysRevLett.98.106803 ↗
3. 10.1016/j.physe.2011.11.00310.1016/j.physe.2011.11.003 ↗
4. 10.1038/nature0684310.1038/nature06843 ↗
5. 10.1126/sciadv.aay232410.1126/sciadv.aay2324 ↗
6. 10.1038/nature1353410.1038/nature13534 ↗
7. 10.1063/5.004861910.1063/5.0048619 ↗
8. Kharbouche-Harrari, M.; Alhalabi, R.; Postel-Pellerin, J.; Wacquez, R.; Aboulkassimi, D.; Nowak, E.; Prejbeanu, I. L.; Prenat, G.; Pendina, G. D. Proceedings - 33rd Conference on Design of Circuits and Integrated Systems, DCIS 2018, MRAM: From STT to SOT, for Security and Memory, 2019; pp 1–6.10.1109/DCIS.2018.8681468 ↗
9. 10.1109/TMSCS.2015.250996310.1109/TMSCS.2015.2509963 ↗
10. Prenat G. · 2015 · 14510.1007/978-3-319-15180-9_4 ↗
11. 10.1063/5.013583110.1063/5.0135831 ↗
12. Garello, K.; Yasin, F.; Kar, G. S. Spin-Orbit Torque MRAM for Ultrafast Embedded Memories: From Fundamentals to Large Scale Technology Integration, 2019 IEEE 11th International Memory Workshop, IMW 2019, 2019; pp 1–4.10.1109/IMW.2019.8739466 ↗
13. 10.1063/1.219947310.1063/1.2199473 ↗
14. 10.1063/1.493745210.1063/1.4937452 ↗
15. 10.1038/nmat352210.1038/nmat3522 ↗
16. 10.1103/PhysRevB.78.04542610.1103/PhysRevB.78.045426 ↗
17. 10.1038/s41563-018-0137-y10.1038/s41563-018-0137-y ↗
18. 10.1103/PhysRevLett.106.19680110.1103/PhysRevLett.106.196801 ↗
19. 10.1038/nphys127010.1038/nphys1270 ↗
20. 10.1021/acsami.1c0316810.1021/acsami.1c03168 ↗
21. 10.1038/s41563-018-0136-z10.1038/s41563-018-0136-z ↗
22. 10.1063/5.004112310.1063/5.0041123 ↗
23. Manchon A. · 2017 · 68
24. 10.1126/science.121819710.1126/science.1218197 ↗
25. 10.1038/s41598-020-69027-610.1038/s41598-020-69027-6 ↗
26. 10.35848/1347-4065/ab91d010.35848/1347-4065/ab91d0 ↗
27. 10.1109/TMAG.2021.311516910.1109/TMAG.2021.3115169 ↗
28. 10.1109/TMAG.2023.327517110.1109/TMAG.2023.3275171 ↗
29. 10.1063/1.497549210.1063/1.4975492 ↗
30. 10.1063/5.008492710.1063/5.0084927 ↗
31. York, B.; Hai, P.; Le, Q.; Hwang, C.; Nguyen, K.; Ho, H.; Sasaki, J.; Liu, X.; Le, S.; Ho, M.; Takano, H. The Practical Material Challenges Involved in Using the Topological Insulator BiSb in a Spin Transfer Device, 32nd Magnetic Recording Conference, TMRC 2021, 2021; pp 31–32.10.1109/TMRC53175.2021.9605108 ↗
32. 10.1103/PhysRevApplied.19.03401210.1103/PhysRevApplied.19.034012 ↗
33. 10.1103/PhysRevLett.116.09660210.1103/PhysRevLett.116.096602 ↗
34. 10.1103/PhysRevLett.120.16720110.1103/PhysRevLett.120.167201 ↗
35. 10.1063/5.003717810.1063/5.0037178 ↗
36. 10.1103/PhysRevApplied.21.02402110.1103/PhysRevApplied.21.024021 ↗
37. 10.1038/ncomms1064410.1038/ncomms10644 ↗
38. 10.1007/s10854-018-0029-610.1007/s10854-018-0029-6 ↗
39. 10.1016/S1001-0521(08)60150-310.1016/S1001-0521(08)60150-3 ↗
40. 10.1103/PhysRevB.76.04530210.1103/PhysRevB.76.045302 ↗
41. 10.1038/nature0684310.1038/nature06843 ↗
42. 10.1557/mrs.2014.19510.1557/mrs.2014.195 ↗
43. 10.1103/PhysRevLett.121.13680510.1103/PhysRevLett.121.136805 ↗
44. 10.1088/1361-6528/acda3610.1088/1361-6528/acda36 ↗
45. 10.1103/PhysRevB.108.24541810.1103/PhysRevB.108.245418 ↗