Anisotropic Magnetoresistance and Planar Hall Effect in Layered Room-Temperature Ferromagnet Cr1.2Te2
Source abstract
Abstract
Two-dimensional (2D) van der Waals ferromagnets are regarded as a breakthrough for the 2D spintronics community, which has attracted a great deal of interest in developing low-dimension spintronic devices. Anisotropic magnetoresistance (AMR) and the planar Hall effect (PHE) are instrumental in realizing highly sensitive magnetic sensors and nonvolatile memory devices. Despite being discovered in many 2D ferromagnets, most exhibit relatively weak AMR and PHE effects, and their Curie temperature is below room temperature. Here, we report the effects of PHE and AMR at room temperature in the layered ferromagnet of Cr 1.2 Te 2 flakes that exhibit high saturation magnetization and low coercivity, as evidenced by the angular-dependent transport measurements. The low-temperature magnetoresistance behavior of the Cr 1.2 Te 2 flake reveals a truly remarkable 4-fold AMR effect, resulting from the material’s high-term lattice symmetry, which is distinct from the traditional 2-fold AMR. These valuable insights provide a better understanding of high-order AMR in layered magnetic materials. Our findings demonstrate the immense promise of Cr 1.2 Te 2 in driving the development of future 2D spintronic applications that operate at room temperature.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: 2D Materials and Applications · Multiferroics and related materials · Electronic and Structural Properties of Oxides
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Department of Materials Science & Engineering, CAS Key Lab of Materials for Energy Conversion, Anhui Laboratory of Advanced Photon Science and Technology, University of Science and Technology of China, Hefei 230026, China
School of Science, Nanjing University of Posts and Telecommunications, Nanjing 210023, China
Funding
Ministry of Science and Technology of the People's Republic of China · National Synchrotron Radiation Laboratory
References (51)
Show source-provided references
1. 10.1063/1.216282410.1063/1.2162824 ↗
2. 10.1109/JPROC.2016.259014210.1109/JPROC.2016.2590142 ↗
3. 10.1063/1.131131610.1063/1.1311316 ↗
4. 10.1146/annurev.ms.25.080195.00204110.1146/annurev.ms.25.080195.002041 ↗
5. 10.1109/20.31227910.1109/20.312279 ↗
6. 10.1016/j.sna.2017.08.01810.1016/j.sna.2017.08.018 ↗
7. 10.1063/1.175938010.1063/1.1759380 ↗
8. 10.1103/PhysRevLett.107.08660310.1103/PhysRevLett.107.086603 ↗
9. 10.1063/1.283000810.1063/1.2830008 ↗
10. 10.1063/1.11369710.1063/1.113697 ↗
11. 10.1063/1.169519710.1063/1.1695197 ↗
12. 10.1103/PhysRevLett.90.10720110.1103/PhysRevLett.90.107201 ↗
13. 10.1126/science.aav445010.1126/science.aav4450 ↗
14. 10.1038/s41586-018-0631-z10.1038/s41586-018-0631-z ↗
15. 10.1038/s41467-018-04953-810.1038/s41467-018-04953-8 ↗
16. 10.1021/acsnano.1c0048810.1021/acsnano.1c00488 ↗
17. 10.1103/PhysRevB.103.02443610.1103/PhysRevB.103.024436 ↗
18. 10.1103/PhysRevB.102.14443310.1103/PhysRevB.102.144433 ↗
19. 10.1021/acs.nanolett.1c0049310.1021/acs.nanolett.1c00493 ↗
20. 10.1063/1.501140510.1063/1.5011405 ↗
21. 10.1016/j.jallcom.2021.16181810.1016/j.jallcom.2021.161818 ↗
22. 10.1007/s12274-020-3021-410.1007/s12274-020-3021-4 ↗
23. 10.1016/j.jcrysgro.2022.12654110.1016/j.jcrysgro.2022.126541 ↗
24. 10.1088/0953-8984/27/17/17600210.1088/0953-8984/27/17/176002 ↗
25. 10.1088/2053-1583/abfaae10.1088/2053-1583/abfaae ↗
26. 10.1103/PhysRevMaterials.4.11400110.1103/PhysRevMaterials.4.114001 ↗
27. 10.1016/0022-3697(57)90028-810.1016/0022-3697(57)90028-8 ↗
28. 10.1016/0038-1098(75)90888-110.1016/0038-1098(75)90888-1 ↗
29. 10.1143/JPSJ.32.63510.1143/JPSJ.32.635 ↗
30. 10.1103/PhysRevB.101.21441310.1103/PhysRevB.101.214413 ↗
31. 10.1103/PhysRevB.100.02443410.1103/PhysRevB.100.024434 ↗
32. 10.1103/PhysRevResearch.4.01313410.1103/PhysRevResearch.4.013134 ↗
33. 10.1021/acs.nanolett.1c0323210.1021/acs.nanolett.1c03232 ↗
34. 10.1016/j.jmmm.2020.16654710.1016/j.jmmm.2020.166547 ↗
35. 10.1103/PhysRevMaterials.3.01420110.1103/PhysRevMaterials.3.014201 ↗
36. 10.1103/PhysRevB.99.15511910.1103/PhysRevB.99.155119 ↗
37. 10.1103/PhysRevB.98.16111010.1103/PhysRevB.98.161110 ↗
38. 10.1103/PhysRevB.98.04110310.1103/PhysRevB.98.041103 ↗
39. 10.1038/nphys364810.1038/nphys3648 ↗
40. 10.1140/epjp/i2018-12350-110.1140/epjp/i2018-12350-1 ↗
41. 10.1103/PhysRevB.77.15520310.1103/PhysRevB.77.155203 ↗
42. 10.1063/1.489217910.1063/1.4892179 ↗
43. 10.1143/JPSJ.81.02470510.1143/JPSJ.81.024705 ↗
44. 10.1143/APEX.3.11300310.1143/APEX.3.113003 ↗
45. 10.1063/1.493617510.1063/1.4936175 ↗
46. 10.1063/1.349969610.1063/1.3499696 ↗
47. 10.1088/0953-8984/22/14/14600610.1088/0953-8984/22/14/146006 ↗
48. 10.1021/am509173r10.1021/am509173r ↗
49. 10.1103/PhysRevLett.128.24720210.1103/PhysRevLett.128.247202 ↗
50. 10.1103/PhysRevB.78.21440210.1103/PhysRevB.78.214402 ↗
51. 10.1016/j.physleta.2012.08.00910.1016/j.physleta.2012.08.009 ↗