journal article·2020-03-24Open access

Forming-Less Compliance-Free Multistate Memristors as Synaptic Connections for Brain-Inspired Computing

Sien Ng, Rohit Abraham John, Jing-ting Yang, Nripan Mathews

Abstract

Hardware realization of artificial neural networks (ANNs) requires analogue weights to be encoded into the device conductances via blind update and access operations, leveraging Kirchhoff’s circuit laws. However, most memristive solutions lag behind in this aspect due to numerous device nonidealities, like limited number of addressable states, need for a stringent compliance current control, and an electroforming process. By modulating the oxygen vacancy profile of tin oxide switching elements, here we design and evaluate multistate memristors as synaptic connections for brain-inspired computing. Harnessing the advantages of a forming-less compliance-free operation, our devices display gradual switching transitions across multiple conductance states, sufficing the switching requirements of synaptic connections in an ANN. The soft boundary conditions are analyzed systematically, and spike-based plasticity rules, state-dependent spike-timing-dependent-plasticity (STDP) modulations, ternary digital logic, and analogue updatability schemes are proposed and demonstrated comprehensively to establish the analogue programming window of our memristors.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: Advanced Memory and Neural Computing · Neural dynamics and brain function · Neuroscience and Neural Engineering

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

School of Materials Science and Engineering, Nanyang Technological University, 50 Nanyang Avenue, Singapore 639798, Singapore

Energy Research Institute@NTU (ERI@N), Nanyang Technological University, Singapore 637553, Singapore

Funding

Ministry of Education - Singapore

References (35)

Show source-provided references
1. 10.1002/adfm.20120238310.1002/adfm.201202383 ↗
2. 10.1002/smll.20170119310.1002/smll.201701193 ↗
3. 10.1080/23746149.2016.125958510.1080/23746149.2016.1259585 ↗
4. 10.1109/TNNLS.2014.238339510.1109/TNNLS.2014.2383395 ↗
5. 10.1021/nl904092h10.1021/nl904092h ↗
6. 10.1109/101.99485610.1109/101.994856 ↗
7. Zhao, W.; Querlioz, D.; Klein, J.O.; Chabi, D.; Chappert, C. In Nanodevice-Based Novel Computing Paradigms and the Neuromorphic Approach, 2012 IEEE International Symposium on Circuits and Systems; IEEE, 2012; pp 2509–2512.10.1109/ISCAS.2012.6271812 ↗
8. 10.1038/ncomms415810.1038/ncomms4158 ↗
9. 10.1021/acsnano.8b0590310.1021/acsnano.8b05903 ↗
10. 10.1002/adma.20180022010.1002/adma.201800220 ↗
11. 10.1088/0957-4484/24/38/38401010.1088/0957-4484/24/38/384010 ↗
12. 10.1109/LED.2012.220742910.1109/LED.2012.2207429 ↗
13. 10.1021/acs.nanolett.6b0178110.1021/acs.nanolett.6b01781 ↗
14. 10.1063/1.504246210.1063/1.5042462 ↗
15. 10.1038/s41598-018-19575-910.1038/s41598-018-19575-9 ↗
16. 10.1038/nnano.2016.8710.1038/nnano.2016.87 ↗
17. 10.1038/nnano.2008.16010.1038/nnano.2008.160 ↗
18. 10.1002/adma.20150275810.1002/adma.201502758 ↗
19. 10.1002/aelm.20160051010.1002/aelm.201600510 ↗
20. 10.1021/acsami.7b0292110.1021/acsami.7b02921 ↗
21. 10.1186/s11671-017-2155-010.1186/s11671-017-2155-0 ↗
22. 10.1063/1.494020310.1063/1.4940203 ↗
23. Burr, G. W.; Narayanan, P.; Shelby, R. M.; Sidler, S.; Boybat, I.; di Nolfo, C.; Leblebici, Y. In Large-Scale Neural Networks Implemented with Non-Volatile Memory as the Synaptic Weight Element: Comparative Performance Analysis (Accuracy, Speed, and Power), 2015 IEEE International Electron Devices Meeting (IEDM), IEEE, 2015; p 4.10.1109/IEDM.2015.7409625 ↗
24. 10.1109/TED.2015.243963510.1109/TED.2015.2439635 ↗
25. 10.1109/TNANO.2013.225099510.1109/TNANO.2013.2250995 ↗
26. 10.1038/s41598-018-25376-x10.1038/s41598-018-25376-x ↗
27. 10.1038/nn185910.1038/nn1859 ↗
28. 10.1109/MNANO.2018.284547910.1109/MNANO.2018.2845479 ↗
29. 10.1101/lm.6410310.1101/lm.64103 ↗
30. 10.3389/fnsyn.2012.0000210.3389/fnsyn.2012.00002 ↗
31. 10.3389/fnsyn.2017.0000710.3389/fnsyn.2017.00007 ↗
32. 10.1002/adma.20180545410.1002/adma.201805454 ↗
33. 10.1038/srep3665210.1038/srep36652 ↗
34. Chen, B.; Lu, Y.; Gao, B.; Fu, Y. H.; Zhang, F. F.; Huang, P.; Chen, Y. S.; Liu, L. F.; Liu, X. Y.; Kang, J. F. In Physical Mechanisms of Endurance Degradation in TMO-RRAM, 2011 International Electron Devices Meeting, IEEE, 2011; pp 12–13.10.1109/IEDM.2011.6131539 ↗
35. Swaidan, Z.; Kanj, R.; El Hajj, J.; Saad, E.; Kurdahi, F. In RRAM Endurance and Retention: Challenges, Opportunities and Implications on Reliable Design, 2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS), IEEE, 2019; pp 402–405.10.1109/ICECS46596.2019.8964707 ↗