journal article·2020-08-25

Pd/IGZO/p+-Si Synaptic Device with Self-Graded Oxygen Concentrations for Highly Linear Weight Adjustability and Improved Energy Efficiency

Donguk Kim, Jun Tae Jang, Eunseon Yu, Jingyu Park, Jungi Min, Dong Myong Kim, Sung-Jin Choi, Hyun-Sun Mo, Seongjae Cho, Kaushik Roy, Dae Hwan Kim

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Abstract

Non-von-Neumann computer architecture is gaining a great deal of interest for eliminating the speed bottleneck in transferring data between the processing and memory units by improving the processing parallelism. Hardware-driven neuromorphic systems are pursued actively for this goal, and they should accompany the innovations in the hardware components for higher energy efficiency. In this work, an indium gallium zinc oxide (IGZO)-based synaptic device was developed, and its synaptic behaviors were closely characterized. Processing simplicity has been improved in the structure of the device using a p+-Si bottom electrode (BE) in the Si substrate, and gradual switching characteristics have been obtained using a Pd top electrode (TE) with self-graded oxygen concentrations. By controlling the amount of oxygen atoms in depositing the switching layer, both highly linear weight adjustability and low-energy operation capability have been accomplished. In the end, the visual recognition of the IGZO synaptic device is evaluated with the Modified National Institute of Standards and Technology (MNIST) patterns in the neural network.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: Advanced Memory and Neural Computing · Neuroscience and Neural Engineering · CCD and CMOS Imaging Sensors

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Department of Electronics Engineering, Kookmin University, 77 Jeongneung-ro, Seongbuk-gu, Seoul 02707, Republic of Korea

Hybrid Device-Based Circadian ICT Research Center, Kookmin University, 77 Jeongneung-ro, Seongbuk-gu, Seoul 02707, Republic of Korea

New Technology Component and Material Research Center (NCMRC), Gachon University, 1342 Seongnam-daero, Sujeong-gu, Seongnam-si, Gyeonggi-do 13120, Republic of Korea

Department of Electrical and Computer Engineering, Purdue University, West Lafayette, Indiana 47906, United States

Department of Electronic Engineering, Gachon University, 1342 Seongnam-daero, Sujeong-gu, Seongnam-si, Gyeonggi-do 13120, Republic of Korea

Funding

National Research Foundation of Korea · Korean Government

References (49)

Show source-provided references
1. 10.5573/JSTS.2019.19.2.15310.5573/JSTS.2019.19.2.153 ↗
2. 10.1002/adfm.20120238310.1002/adfm.201202383 ↗
3. 10.1021/acs.nanolett.8b0402310.1021/acs.nanolett.8b04023 ↗
4. 10.1002/adma.20110259710.1002/adma.201102597 ↗
5. 10.1080/23746149.2016.125958510.1080/23746149.2016.1259585 ↗
6. Arel I. · 2013 · 35 · 1811
7. 10.1038/nmat475610.1038/nmat4756 ↗
8. 10.1109/TNN.2005.86085010.1109/TNN.2005.860850 ↗
9. 10.1109/LED.2017.268120410.1109/LED.2017.2681204 ↗
10. 10.1002/adma.20190617110.1002/adma.201906171 ↗
11. 10.1016/j.sse.2020.10776710.1016/j.sse.2020.107767 ↗
12. 10.1021/acsaelm.9b0001110.1021/acsaelm.9b00011 ↗
13. 10.1109/2.48589110.1109/2.485891 ↗
14. 10.1109/TNNLS.2013.229677710.1109/TNNLS.2013.2296777 ↗
15. 10.1021/acsami.9b0490110.1021/acsami.9b04901 ↗
16. 10.1016/j.orgel.2018.09.00710.1016/j.orgel.2018.09.007 ↗
17. 10.1039/C8NR04136A10.1039/C8NR04136A ↗
18. 10.1063/1.345637910.1063/1.3456379 ↗
19. 10.1021/nl904092h10.1021/nl904092h ↗
20. 10.1021/nl203687n10.1021/nl203687n ↗
21. 10.5573/JSTS.2019.19.1.06910.5573/JSTS.2019.19.1.069 ↗
22. 10.5573/JSTS.2019.19.2.17810.5573/JSTS.2019.19.2.178 ↗
23. 10.1109/TED.2011.210587910.1109/TED.2011.2105879 ↗
24. 10.1016/j.sse.2017.10.02810.1016/j.sse.2017.10.028 ↗
25. 10.1016/j.sse.2017.10.02410.1016/j.sse.2017.10.024 ↗
26. Jang, J. T.; Min, J.; Kim, D.; Park, J.; Choi, S. J.; Kim, D. M.; Kim, D. H. In SPICE Compact Model of IGZO Memristor Based on Non-Quasi Statically Updated Schottky Barrier Height, IEEE 19th International Conference on Nanotechnology (IEEE-NANO); IEEE, 2019; pp 562–565.10.1109/NANO46743.2019.8993957 ↗
27. 10.1021/acsnano.7b0311610.1021/acsnano.7b03116 ↗
28. 10.7567/JJAP.53.12110110.7567/JJAP.53.121101 ↗
29. 10.1007/s12274-016-1288-210.1007/s12274-016-1288-2 ↗
30. Ishizu, T.; Yakubo, Y.; Furutani, K.; Isobe, A.; Fujita, M.; Atsumi, T.; Ando, Y.; Murakawa, T.; Kato, K.; Fujita, M.; Yamazaki, S. In A 48 MHz 880-NW Standby Power Normally-Off MCU with 1 Clock Full Backup and 4.69-Ms Wakeup Featuring 60-Nm Crystalline In-Ga-Zn Oxide BEOL-FETs, IEEE Symposium on VLSI Circuits, Digest of Technical Papers; IEEE, 2019; pp C48–C49.10.23919/VLSIC.2019.8778076 ↗
31. 10.1021/acsomega.7b0116710.1021/acsomega.7b01167 ↗
32. 10.1002/adfm.20110314810.1002/adfm.201103148 ↗
33. 10.1021/acs.nanolett.9b0018010.1021/acs.nanolett.9b00180 ↗
34. 10.1021/acs.nanolett.6b0530810.1021/acs.nanolett.6b05308 ↗
35. 10.1021/acs.nanolett.5b0069710.1021/acs.nanolett.5b00697 ↗
36. 10.1109/LED.2018.278942510.1109/LED.2018.2789425 ↗
37. 10.1021/acsnano.6b0789410.1021/acsnano.6b07894 ↗
38. 10.1109/TED.2016.261564810.1109/TED.2016.2615648 ↗
39. 10.1063/1.279047910.1063/1.2790479 ↗
40. 10.3390/electronics810108710.3390/electronics8101087 ↗
41. 10.1016/j.sse.2018.10.00310.1016/j.sse.2018.10.003 ↗
42. 10.1155/2018/264728210.1155/2018/2647282 ↗
43. 10.1021/nn405827t10.1021/nn405827t ↗
44. 10.1063/1.362447210.1063/1.3624472 ↗
45. 10.1109/JPROC.2018.279084010.1109/JPROC.2018.2790840 ↗
46. 10.1109/JPROC.2012.219036910.1109/JPROC.2012.2190369 ↗
47. 10.7567/APEX.7.03140110.7567/APEX.7.031401 ↗
48. 10.1038/srep1490210.1038/srep14902 ↗
49. 10.1088/0957-4484/27/36/36520410.1088/0957-4484/27/36/365204 ↗