journal article·2019-01-22

High Breakdown Strength Schottky Diodes Made from Electrodeposited ZnO for Power Electronics Applications

Mourad Benlamri, Benjamin D. Wiltshire, Yun Zhang, Najia Mahdi, Karthik Shankar, Douglas W. Barlage

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Abstract

The synthesis of ZnO films by optimized electrodeposition led to the achievement of a critical electric field of 800 kV/cm. This value, which is 2–3 times higher than in monocrystalline silicon, was derived from a vertical Schottky diode application of columnar-structured ZnO films electrodeposited on platinum. The device exhibited a free carrier concentration of 2.5 × 1015 cm–3, a rectification ratio of 3 × 108, and an ideality factor of 1.10, a value uncommonly obtained in solution-processed ZnO. High breakdown strength and high thickness capability make this environment-friendly process a serious option for power electronics and energy harvesting.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: ZnO doping and properties · Ga2O3 and related materials · Gas Sensing Nanomaterials and Sensors

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Department of Electrical and Computer Engineering, University of Alberta, Edmonton, AB T6G 1H9, Canada

School of Engineering, University of British Columbia, Kelowna, BC V1V 1V7, Canada

Funding

Natural Sciences and Engineering Research Council of Canada · CMC Microsystems · Alberta Innovates - Technology Futures · National Institute for Nanotechnology · Canada First Research Excellence Fund

References (30)

Show source-provided references
1. 10.1016/S0921-5107(00)00604-810.1016/S0921-5107(00)00604-8 ↗
2. 10.1109/16.29775110.1109/16.297751 ↗
3. 10.1109/TNS.2015.241783110.1109/TNS.2015.2417831 ↗
4. 10.1039/C7TC02221B10.1039/C7TC02221B ↗
5. 10.1021/acsami.8b0703010.1021/acsami.8b07030 ↗
6. Kizilyalli, I. C.; Xu, Y. A.; Carlson, E.; Manser, J.; Cunningham, D. W. In Current and Future Directions in Power Electronic Devices and Circuits Based on Wide Band-Gap Semiconductors, 2017 IEEE 5th Workshop on Wide Bandgap Power Devices and Applications (WiPDA), 30 Oct–1 Nov 2017; 2017; p 417.10.1109/WiPDA.2017.8170583 ↗
7. Eckardt, B.; Wild, M.; Joffe, C.; Zeltner, S.; Endres, S.; Maerz, M. In Advanced Vehicle Charging Solutions Using SiC and GaN Power Devices, PCIM Europe 2018; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, 5–7 June 2018; 2018; pp 1–6.
8. 10.1109/TNANO.2010.208501310.1109/TNANO.2010.2085013 ↗
9. Donigan, T.; Langley, D.; Schuette, M.; Crespo, A.; Walker, D.; Tetlak, S.; Leedy, K.; Jessen, G. In Subtractive Plasma-Etch Process for Patterning High Performance ZnO TFTs, 2015 73rd Annual Device Research Conference (DRC), 21–24 June 2015; 2015; pp 199–200.10.1109/DRC.2015.7175632 ↗
10. 10.1088/0022-3727/49/43/43300110.1088/0022-3727/49/43/433001 ↗
11. 10.1109/55.4309810.1109/55.43098 ↗
12. 10.1039/C6TC00644B10.1039/C6TC00644B ↗
13. 10.1149/2.0161606jss10.1149/2.0161606jss ↗
14. 10.1016/j.spmi.2014.05.03210.1016/j.spmi.2014.05.032 ↗
15. 10.1063/1.176959810.1063/1.1769598 ↗
16. Litton C. W. · 201110.1002/9781119991038 ↗
17. 10.1063/1.485840010.1063/1.4858400 ↗
18. Sze S. M. · 200610.1002/0470068329 ↗
19. 10.1088/0957-4484/21/37/37520210.1088/0957-4484/21/37/375202 ↗
20. 10.1007/s00339-009-5086-510.1007/s00339-009-5086-5 ↗
21. 10.1021/am201656h10.1021/am201656h ↗
22. 10.1039/C5RA18642K10.1039/C5RA18642K ↗
23. 10.1063/1.289456810.1063/1.2894568 ↗
24. 10.1063/1.282870210.1063/1.2828702 ↗
25. 10.1016/j.spmi.2013.09.03110.1016/j.spmi.2013.09.031 ↗
26. 10.1016/j.mssp.2018.10.01310.1016/j.mssp.2018.10.013 ↗
27. 10.1063/1.352593210.1063/1.3525932 ↗
28. Morkoc H. · 200910.1002/9783527623945 ↗
29. 10.1016/j.sse.2012.05.00510.1016/j.sse.2012.05.005 ↗
30. 10.1088/0268-1242/20/4/00610.1088/0268-1242/20/4/006 ↗