journal article·1992-05

Optical properties of polycrystalline CdSe films

Tapan K. Gupta, Jim Doh

Journal of Materials Research· Volume 7· Issue 5
Publisher page

Abstract

The optical properties of polycrystalline CdSe films prepared using electroless deposition techniques are discussed. Refractive index measurements are reported for the wavelength region 400–2000 nm. Extinction and absorption coefficient measurements are reported for the strong absorption regime (450–750 nm). UV reflectance measurements are also discussed.
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Research context

OpenAlex topics: Quantum Dots Synthesis And Properties · Chalcogenide Semiconductor Thin Films · Semiconductor materials and interfaces

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