journal article·2002-01

Tb L3-edge X-ray Absorption Near-edge Structure Spectroscopic Analysis of Terbium-doped Phosphor Compoundsfor Plasma Display Panel Applications

Yong Gyu Choi, Kee-Sun Sohn, Kyong Hon Kim, Hee Dong Park

Journal of Materials Research· Volume 17· Issue 1
Publisher page

Abstract

We have analyzed Tb L3-edge x-ray absorption near-edge structure spectra of Tb-doped phosphor compounds for plasma display panel applications. Intensity and lifetime of the green emission from the Tb3+:5D4→7F5 transition were measured with respect to nominal terbium concentration in the host compounds, i.e., YBO3, YPO4,and Y4Al2O9, all of which were made through the solid-state reaction. Typical concentration quenching was evident on the fluorescence intensity and the fluorescing level lifetime in our samples. From the analyses of white line absorption peaks at TbL3-edge, it was verified that terbium is essentially trivalent in all the samples, even invery highly concentrated ones. Thus, this implies that the concentration quenching was not caused by presence of mixed-valent states of terbium. Instead, it is believed that anonradiative energy transfer route among Tb3+ ions might be responsible for thebehavior.
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Research context

OpenAlex topics: Luminescence Properties of Advanced Materials · X-ray Spectroscopy and Fluorescence Analysis · Advanced Chemical Physics Studies

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