DataVXJournal of Materials ResearchPaper
journal article·2009-04

Characterization of heterogeneities in detector-grade CdZnTe crystals

M.C. Duff, D.B. Hunter, A. Burger, M. Groza, V. Buliga, J.P. Bradley, G. Graham, Z.R. Dai, N. Teslich, D.R. Black, A. Lanzirotti

Journal of Materials Research· Volume 24· Issue 4
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Source abstract

Abstract

Synthetic Cd1–xZnxTe or “CZT” crystals are highly suitable for γ-spectrometers operating at room temperature. Secondary phases (SP) within CZT, presumed to be Te metal, have detrimental impacts on the charge collection efficiency of fabricated device. Using analytical techniques rather than arbitrary theoretical definitions, we identify two SP morphologies: (i) many void, 20-μm “negative” crystals with 65-nm nanoparticle residues of Si, Cd, Zn, and Te and (ii) 20-μm hexagonal-shaped bodies, which are composites of metallic Te layers with cores of amorphous and polycrystalline CZT material that surround the voids.
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Research context

NanomaterialsComposites

OpenAlex topics: Advanced Semiconductor Detectors and Materials · Radiation Detection and Scintillator Technologies · Advanced X-ray and CT Imaging

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

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