Face-centered-cubic titanium: An artifact in titanium/aluminum multilayers
Source abstract
Abstract
The present investigation is the first comprehensive comparative study of x-ray diffraction (XRD) and transmission electron microscopy (TEM) results to address the important issue of fcc Ti formation in nanoscale multilayers. Ti/Al multilayers with 7.2 and 5.2 nm composition modulation wavelengths were studied by reflection and transmission XRD as well as transmission electron diffraction (ED), high-resolution TEM, and energy-filtered TEM. Previous reports have claimed deposition of fcc Ti in multilayer systems. Our results demonstrate that the Ti in Ti/Al multilayers deposits in the hcp form and that fcc Ti is merely an artifact of producing specimens for cross-sectional TEM.
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Research context
OpenAlex topics: Microstructure and mechanical properties · Metal and Thin Film Mechanics · Advanced Materials Characterization Techniques
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References (13)
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1. 10.1051/mmm:0199200302-301870010.1051/mmm:0199200302-3018700 ↗
2. 10.1016/S0167-577X(97)00231-010.1016/S0167-577X(97)00231-0 ↗
3. 10.1016/1359-6454(95)00159-510.1016/1359-6454(95)00159-5 ↗
4. Chaudhuri · 1993 · 308 · 707
5. Ahuja · J. Metals · 1994 · 46 · 35
6. 10.1007/BF0265037110.1007/BF02650371 ↗
7. 10.1016/0022-5088(88)90257-310.1016/0022-5088(88)90257-3 ↗
8. 10.1016/0167-577X(96)80008-510.1016/0167-577X(96)80008-5 ↗
9. 10.1016/0167-577X(94)90039-610.1016/0167-577X(94)90039-6 ↗
10. 10.1103/PhysRevLett.76.377810.1103/PhysRevLett.76.3778 ↗
11. 10.1016/0965-9773(95)00316-910.1016/0965-9773(95)00316-9 ↗
12. 10.1103/PhysRevB.49.490810.1103/PhysRevB.49.4908 ↗
13. 10.1016/0167-577X(94)00272-X10.1016/0167-577X(94)00272-X ↗