Addition of TiO₂ on the electrical properties of buried resistors in low-temperature cofired ceramics

Effects of TiO₂ addition on the conduction mechanism of buried resistors in low temperature cofired ceramics were investigated. Remarkable increases in electrical resistivity and attractive decreases in the temperature coefficient of resistance were observed by the addition of TiO₂ for all ratios of RuO₂/glass investigated. Such significant effects can be attributed to a larger separation observed between RuO₂ particles. The results were compared with the calculated data from theoretical model of tunneling barrier, showing that good agreement could be obtained. In addition, while the distance separation was taken into account as a fixed constant, it was found that the resistivity of buried resistor decreased with increasing TiO₂ contents in the glass at higher weight ratios of TiO₂/glass. This result implies that a substitution takes place due to the Si⁺⁴ displacement by Ti⁺⁴ in the glass, resulting in a looser network structure and a lower resistivity value.