Current trends in nanomechanical testing research
Source abstract
Abstract
Small-scale mechanical characterization is essential for ensuring the service, performance, and lifetime of microscopic components, such as thin films and coatings, electronic sensors, and MEMS (Micro-Electro-Mechanical Systems). The first mechanical measurements on the submicrometer scale were enabled by the development of nanoindentation in the 1980s and early 1990s. From the beginning [1], Journal of Materials Research (JMR) has been the flagship journal for this field. In addition to countless contributed articles, the four previous focus issues published between 1999 and 2012 [2,3,4,5] have strongly contributed to disseminating the latest in method developments and trends in the field. This new focus issue on Advanced Nanomechanical Testing is a unique opportunity to identify and reflect upon the current research trends.
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Research context
OpenAlex topics: Metal and Thin Film Mechanics · Force Microscopy Techniques and Applications · Advanced Surface Polishing Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (41)
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