DataVXJournal of Materials ResearchPaper
journal article·2022-09-14

Resilience of monolayer MoS2 memtransistor under heavy ion irradiation

Christopher M. Smyth, John M. Cain, Eric J. Lang, Ping Lu, Xiaodong Yan, Stephanie E. Liu, Jiangtan Yuan, Matthew P. Bland, Nathan J. Madden, Taisuke Ohta, Vinod K. Sangwan, Mark C. Hersam, Khalid Hattar, Stanley S. Chou, Tzu-Ming Lu

Journal of Materials Research· Volume 37· Issue 17
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OpenAlex topics: Advanced Memory and Neural Computing · 2D Materials and Applications · Ferroelectric and Negative Capacitance Devices

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