Microstructural investigation of BaTiO3thin films deposited on (001) MgO
Source abstract
Abstract
The microstructure of BaTiO3thin films, epitaxially deposited on (001) MgO by pulsed laser ablation, has been investigated by transmission electron microscopy. The films are always c-axis-orientated, but dislocations, {111} stacking faults, and antiphase boundaries are frequently observed. Conventional TEM and high-resolution microscopy allow one to deduce the Burgers vectors of dislocations as b1= 〈100〉 or b2= 〈110〉, both being perfect dislocations. Most extrinsic stacking faults are ending at 1/3〈112〉 or 1/3〈111〉 partial dislocations; the displacement vector of the antiphase boundaries is 1/2〈101〉. Studying the interfacial structure by means of zone images taken along [100] and [110] shows that the misfit is mainly released by dislocations with Burgers vectors of 1/2〈110〉 and 1/2〈101〉.
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Research context
OpenAlex topics: Electronic and Structural Properties of Oxides · Metal and Thin Film Mechanics · Semiconductor materials and devices
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (25)
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