journal article·1996-06

A low-temperature technique for measuring enthalpies of formation

T. P. Weihs, T. W. Barbee, M. A. Wall

Journal of Materials Research· Volume 11· Issue 6
Publisher page

Abstract

A technique to accurately measure the formation enthalpies of transition metal compounds at relatively low temperatures using thick multilayer foils and differential scanning calorimetry is demonstrated. The enthalpy of formation of Cu51Zr14 was measured using 25 μm thick, free-standing Cu–Zr multilayer foils. The multilayers were deposited onto Si substrates using a planetary, magnetron source sputtering system. They were removed from their substrates, cut into 6 mm diameter specimens, and scanned in temperature from 50 °C to 725 °C in a differential scanning calorimeter. Three distinct exothermic reactions were systematically observed. The heats from the first two reactions were summed and then analyzed using a simple model that accounts for interfacial reactions and heat losses during deposition. The enthalpy of formation for Cu51Zr14 was measured to be 14.3 ± 0.3 kJ/mol. This quantity agrees with the single value of ΔHf = 14.07 ± 1.07 kJ/mol reported in the literature for this Cu–Zr compound. The advantages of measuring formation enthalpies using thick multilayer foils and low temperature calorimetry are discussed.
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Research context

OpenAlex topics: Thermodynamic and Structural Properties of Metals and Alloys · nanoparticles nucleation surface interactions · Chemical Thermodynamics and Molecular Structure

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References (21)

Show source-provided references
1. 10.1063/1.9227510.1063/1.92275 ↗
2. 10.1016/0025-5416(84)90123-X10.1016/0025-5416(84)90123-X ↗
3. 10.1016/0364-5916(83)90024-X10.1016/0364-5916(83)90024-X ↗
4. 10.1016/0025-5416(88)90015-810.1016/0025-5416(88)90015-8 ↗
5. 13. Weihs T. P. , Barbee T. W. Jr. , and Wall M. A. , unpublished.
6. 10.1007/BF0266921410.1007/BF02669214 ↗
7. 18. Anamet Laboratories, Inc., 3400 Investment Blvd., Hayward, CA 94545.
8. 10.1063/1.9813610.1063/1.98136 ↗
9. 10.1016/0925-8388(93)90002-510.1016/0925-8388(93)90002-5 ↗
10. 10.1016/0169-4332(89)90513-810.1016/0169-4332(89)90513-8 ↗
11. 10.1103/PhysRevLett.57.229510.1103/PhysRevLett.57.2295 ↗
12. 10.1016/0925-8388(93)90003-610.1016/0925-8388(93)90003-6 ↗
13. 19. Perkin-Elmer Corporation, 761 Main Ave., Norwalk, CT 06859–0156.
14. 10.1016/0025-5416(88)90003-110.1016/0025-5416(88)90003-1 ↗
15. Atzmon · 1993 · 311
16. 10.1002/jemt.107027030610.1002/jemt.1070270306 ↗
17. Kubaschewski · 1979
18. 10.1007/BF0289826010.1007/BF02898260 ↗
19. 10.1016/B978-0-12-170470-4.50012-910.1016/B978-0-12-170470-4.50012-9 ↗
20. Weihs · 1993 · 311
21. 10.1007/BF0266775510.1007/BF02667755 ↗