Electrochemical corrosion study of Sn–XAg–0.5Cu alloys in 3.5% NaCl solution
Source abstract
Abstract
The electrochemical corrosion behavior of Sn–XAg–0.5Cu alloys in 3.5% NaCl solution was examined using potentiodynamic polarization techniques. The Ag content in the alloy was varied from 1 to 4 wt%. The polarization curves obtained for the alloys show an active–passive transition followed by a transpassive region. Sn–XAg–0.5Cu alloys with higher Ag content (>2 wt%) show a strong tendency toward passivation. The passivation behavior has been ascribed to the presence of both SnO and SnO2on the anode surface. Increase in Ag content from 1 to 4 wt% results in a decrease in the corrosion-current density (Icorr) and linear polarization resistance (LPR) of the alloy. Nevertheless, the corrosion potential (Ecorr) shifts toward negative values, and a decrease in corrosion rate is observed. The presence of Cl−ion initiates pitting and is responsible for the rupture of the passive layer at a certain breakdown potential. The breakdown potential (EBR) decreases and shifts toward more noble values with increase in Ag content in the alloy. Surface analyses by x-ray photoelectron spectroscopy (XPS) and Auger depth profile studies confirmed the formation of both Sn(II) and Sn(IV) oxides in the passive layer.
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Research context
OpenAlex topics: Electronic Packaging and Soldering Technologies · Corrosion Behavior and Inhibition · Hydrogen embrittlement and corrosion behaviors in metals
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (46)
Show source-provided references
1. 10.1016/0039-6028(76)90026-110.1016/0039-6028(76)90026-1 ↗
2. 44 Briggs D. Seah M.P. : Practical Surface Analysis,, Publication No. 150, Vol. 1, 2nd ed. (John Wiley and Sons 1993)
3. 10.1021/j100441a00710.1021/j100441a007 ↗
4. Moulder · 1992
5. 39 Von Trzebiatowski O. , Janczak J. Sutter T. : Microelectrochemical corrosion studies on lead free Sn–Ag–Cu solder alloys. Oral presentation at E-MRS Fall meeting, 2005.
6. 10.1016/S0010-938X(70)80023-310.1016/S0010-938X(70)80023-3 ↗
7. 10.1016/S0013-4686(97)10188-810.1016/S0013-4686(97)10188-8 ↗
8. 10.1016/j.electacta.2006.02.02910.1016/j.electacta.2006.02.029 ↗
9. 10.1016/j.corsci.2004.04.00710.1016/j.corsci.2004.04.007 ↗
10. Effects of reflow processing and flux residue on ionic migration of lead-free solder plating using the quartz crystal microbalance method.
11. 1987
12. 28 Chen K.I. Lin K.L. International Symposium on Electronic Materials and Packaging, Hsinchu, Taiwan. 49 (2002)
13. 10.1016/S0167-577X(03)00326-410.1016/S0167-577X(03)00326-4 ↗
14. 10.1557/jmr.2006.003510.1557/jmr.2006.0035 ↗
15. 10.1016/j.jallcom.2003.12.00510.1016/j.jallcom.2003.12.005 ↗
16. 22 JEIDA Challenges and Efforts Towards Commercialization of Lead-Free Solder Road Map 2000, Ver. 13, (Japan Electronics Industry Development Association, 2000
17. 10.1007/s11664-998-0205-110.1007/s11664-998-0205-1 ↗
18. 10.1023/A:102282212719310.1023/A:1022822127193 ↗
19. 10.1007/s11664-002-0184-610.1007/s11664-002-0184-6 ↗
20. 10.1016/S0022-0728(03)00249-310.1016/S0022-0728(03)00249-3 ↗
21. 10.1080/00202967.2002.1187146810.1080/00202967.2002.11871468 ↗
22. 10.2320/matertrans1989.39.43910.2320/matertrans1989.39.439 ↗
23. 10.1149/1.160668710.1149/1.1606687 ↗
24. 10.1016/0013-4686(85)80188-210.1016/0013-4686(85)80188-2 ↗
25. Composite plating of Sn–Ag alloys for Pb-free soldering.
26. 10.1016/0257-8972(94)02392-110.1016/0257-8972(94)02392-1 ↗
27. Baker · Plat. Surf. Finish. · 1983 · 70 · 63
28. Solderability of bright acid chock deposits (aptitude for the soldering of the brilliant tin coatings in acid medium).
29. 1 Stack J.R. Tin, lead, and tin-lead alloy plating baths. U.S. Patent No. 2313371, March, 1943
30. 10.1023/B:JACH.0000003850.61488.8310.1023/B:JACH.0000003850.61488.83 ↗
31. Polarographic study on the smoothing of Sn–Ag alloy film electrodeposited from pyrophosphate iodide bath.10.5796/electrochemistry.69.254 ↗
32. 10.1016/S0925-8388(02)01166-010.1016/S0925-8388(02)01166-0 ↗
33. 6 European Parliament Proposal for a Directive of the European Parliament and of the Council on Waste Electrical and Electronic Equipment and the Restriction of the Use of Certain Hazardous Substances in Electrical and Electronic Equipment, (COM 2000) p. 347
34. Electrodeposition and properties of a silver–tin alloy.
35. 33 Kristen J. : Atlas of metal ligand equilibrium in aqueous solutions. Chester, 1978 623
36. 10.1023/A:102282212719310.1023/A:1022822127193 ↗
37. Sn–Cu solder bump formation from acid sulfate baths using electroplating method.10.5796/electrochemistry.71.791 ↗
38. 10.1016/S0921-5107(98)00113-510.1016/S0921-5107(98)00113-5 ↗
39. 10.1149/1.175689010.1149/1.1756890 ↗
40. 10.1149/1.146340410.1149/1.1463404 ↗
41. 10.1149/1.213365410.1149/1.2133654 ↗
42. Adem · 1989
43. Research update: lead-free solder alternatives.
44. 10.1016/j.matchemphys.2003.11.02510.1016/j.matchemphys.2003.11.025 ↗
45. 10.1557/JMR.2003.030710.1557/JMR.2003.0307 ↗
46. 10.1016/S0013-4686(96)00212-510.1016/S0013-4686(96)00212-5 ↗