journal article·2017-04-28

Measuring critical stress for shear failure of interfacial regions in coating/interlayer/substrate systems through a micro-pillar testing protocol

Yang Mu, Xiaoman Zhang, John W. Hutchinson, Wen Jin Meng

Journal of Materials Research· Volume 32· Issue 8
Publisher page

Abstract

Mechanical integrity of the interfacial region between ceramic coatings and substrates is critical to high performance coated mechanical components and manufacturing tools. Mechanical failure of the coating/substrate interfacial region often leads to catastrophic failure of the coated system as a whole. Despite extensive research over the past two decades, quantitative assessment of the mechanical response of coating/substrate interfacial regions remains a challenge. The lack of reliable protocols for measuring the mechanical response of coating/substrate interfacial regions quantitatively hampers the understanding of key factors controlling the mechanical integrity of coating/substrate interfaces. In this paper, we describe a new micro-pillar testing protocol for quantitative measurement of critical stresses for inducing shear failure of interfacial regions in ceramic-coating/metal-adhesion-layer/substrate systems. We observe significant differences in the critical stress for shear failure of interfacial regions in CrN/Cu/Si, CrN/Cr/Si, and CrN/Ti/Si systems. The present testing protocol has general applicability to a wide range of coating/interlayer/substrate systems.
Source: expertdata · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: Advanced Surface Polishing Techniques · Metal and Thin Film Mechanics · Electronic Packaging and Soldering Technologies

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (27)

Show source-provided references
1. 10.1098/rsta.2010.019410.1098/rsta.2010.0194 ↗
2. Holmberg · 1994
3. 10.1016/0001-6160(89)90120-X10.1016/0001-6160(89)90120-X ↗
4. 10.1016/S0040-6090(99)00342-910.1016/S0040-6090(99)00342-9 ↗
5. 10.1016/S1359-6454(00)00108-710.1016/S1359-6454(00)00108-7 ↗
6. 10.1557/JMR.1997.026010.1557/JMR.1997.0260 ↗
7. 10.1016/j.eml.2014.12.00110.1016/j.eml.2014.12.001 ↗
8. 10.1016/S0257-8972(01)01290-710.1016/S0257-8972(01)01290-7 ↗
9. 10.1016/S0257-8972(99)00457-010.1016/S0257-8972(99)00457-0 ↗
10. 10.1098/rspa.1996.012410.1098/rspa.1996.0124 ↗
11. Brown · 1995 · 1 · 1510.1515/9783112318966-003 ↗
12. 10.1063/1.166193510.1063/1.1661935 ↗
13. 10.1016/j.ijmachtools.2014.11.00210.1016/j.ijmachtools.2014.11.002 ↗
14. 10.1016/0257-8972(96)80011-910.1016/0257-8972(96)80011-9 ↗
15. 10.1016/j.surfcoat.2013.09.01410.1016/j.surfcoat.2013.09.014 ↗
16. 10.1016/j.msea.2011.07.00110.1016/j.msea.2011.07.001 ↗
17. 10.1557/mrc.2016.2010.1557/mrc.2016.20 ↗
18. Thickness dependence of flow stress of Cu thin films in confined shear plastic flow10.1557/mrc.2014.26 ↗
19. 10.1557/mrc.2014.310.1557/mrc.2014.3 ↗
20. Bull · 2001 · 2 · 107
21. Kattamis · 1995 · 1 · 14310.1515/9783112318966-011 ↗
22. 10.1016/S0257-8972(03)00445-610.1016/S0257-8972(03)00445-6 ↗
23. 10.1016/S0257-8972(03)00467-510.1016/S0257-8972(03)00467-5 ↗
24. 10.1557/jmr.2007.014010.1557/jmr.2007.0140 ↗
25. 10.1007/s10853-006-0171-z10.1007/s10853-006-0171-z ↗
26. 10.1016/j.surfcoat.2015.06.07510.1016/j.surfcoat.2015.06.075 ↗
27. Cullity · 2001