journal article·2004-01

Size effect measurement and characterization in nanoindentation test

Yueguang Wei, Xuezheng Wang, Manhong Zhao

Journal of Materials Research· Volume 19· Issue 1
Publisher page

Abstract

Nanoindentation test at scale of hundreds of nanometers has shown that measured hardness increases strongly with decreasing indent depth, which is frequently referred to as the size effect. Usually, the size effect is displayed in the hardness-depth curves. In this study, the size effect is characterized in both the load–displacement curves and the hardness–depth curves. The experimental measurements were performed for single-crystal copper specimen and for surface-nanocrystallized Al-alloy specimen. Moreover, the size effect was characterized using the dislocation density theory. To investigate effects of some environmental factors, such as the effect of surface roughness and the effect of indenter tip curvature, the specimen surface profile and the indentation imprint profile for single-crystal copper specimen were scanned and measured using the atomic force microscopy technique. Furthermore, the size effect was characterized and analyzed when the effect of the specimen surface roughness was considered.
Source: crossref · Quality: baseline

Research context

OpenAlex topics: Metal and Thin Film Mechanics · Microstructure and mechanical properties · Advanced materials and composites

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (27)

Show source-provided references
1. 10.1016/0956-7151(94)90502-910.1016/0956-7151(94)90502-9 ↗
2. 10.1179/02670839910150570710.1179/026708399101505707 ↗
3. 10.1007/BF0287228510.1007/BF02872285 ↗
4. 10.1016/S0022-5096(97)00086-010.1016/S0022-5096(97)00086-0 ↗
5. Shaw · 1966 · 443
6. 10.1016/S0022-5096(99)00022-810.1016/S0022-5096(99)00022-8 ↗
7. 10.1557/JMR.1995.085310.1557/JMR.1995.0853 ↗
8. 10.1007/BF0036076410.1007/BF00360764 ↗
9. 10.1016/0956-7151(93)90100-710.1016/0956-7151(93)90100-7 ↗
10. 10.1016/S0065-2156(08)70388-010.1016/S0065-2156(08)70388-0 ↗
11. 10.1557/JMR.1998.014710.1557/JMR.1998.0147 ↗
12. 10.1016/S0022-5096(98)00018-010.1016/S0022-5096(98)00018-0 ↗
13. 10.1016/S0022-5096(01)00103-X10.1016/S0022-5096(01)00103-X ↗
14. 10.1080/1478643700823842610.1080/14786437008238426 ↗
15. 10.1557/JMR.1998.018510.1557/JMR.1998.0185 ↗
16. 10.1016/S0020-7683(97)00112-110.1016/S0020-7683(97)00112-1 ↗
17. 10.1016/1359-6462(95)00524-210.1016/1359-6462(95)00524-2 ↗
18. 10.1557/JMR.1995.290810.1557/JMR.1995.2908 ↗
19. 10.1007/BF0248767610.1007/BF02487676 ↗
20. 10.1557/JMR.2000.025810.1557/JMR.2000.0258 ↗
21. 10.1115/1.148040910.1115/1.1480409 ↗
22. 10.1016/j.jmps.2003.09.01110.1016/j.jmps.2003.09.011 ↗
23. 10.1016/S0022-5096(98)00103-310.1016/S0022-5096(98)00103-3 ↗
24. 10.1016/S0020-7683(97)00349-110.1016/S0020-7683(97)00349-1 ↗
25. Weiss · Phys. Status Solidi A · 1992 · 129 · 16710.1002/pssa.2211290115 ↗
26. 10.1557/JMR.1999.030210.1557/JMR.1999.0302 ↗
27. 10.1557/JMR.1992.156410.1557/JMR.1992.1564 ↗