journal article·2002-06

Isothermal Capacitance Transient Spectroscopy for Deep Levels in Co- and Mn-doped ZnO Single Crystals

Naoki Ohashi, Junzo Tanaka, Takeshi Ohgaki, Hajime Haneda, Mio Ozawa, Takaaki Tsurumi

Journal of Materials Research· Volume 17· Issue 6
Publisher page

Abstract

Deep donor levels in ZnO single crystals doped with transition metal (TM; Co or Mn) were characterized by isothermal capacitance transient spectroscopy (ICTS) applied to ZnO-based Schottky junctions, Au/ZnO (0001) or Ag/ZnO (0001). The barrier height at the junction and donor concentration was not influenced by TM. A deep donor level at 0.28 eV was detected by ICTS; however, its energy dispersion and concentration was composition independent. The effect of doping with TM was found in the magnitude of leakage current; in other words, the leakage current at the Au/ZnO:Mn junction was lower than the other junctions on undoped or Co-doped crystals.
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Research context

OpenAlex topics: ZnO doping and properties · Semiconductor materials and interfaces · Gas Sensing Nanomaterials and Sensors

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References (41)

Show source-provided references
1. Hirschwald · 7 · 153
2. 10.1016/0038-1101(73)90122-610.1016/0038-1101(73)90122-6 ↗
3. 10.1016/0038-1101(70)90060-210.1016/0038-1101(70)90060-2 ↗
4. 10.1016/0039-6028(80)90374-X10.1016/0039-6028(80)90374-X ↗
5. 10.1063/1.165950910.1063/1.1659509 ↗
6. 32. Sze S.M. , Physics of Semiconductor Devices, 2nd ed. (John Wiley and Sons, New York, 1981) p. 279.
7. 10.4028/www.scientific.net/KEM.157-158.22710.4028/www.scientific.net/KEM.157-158.227 ↗
8. 10.1143/JJAP.39.L55510.1143/JJAP.39.L555 ↗
9. 10.1143/JJAP.38.L11310.1143/JJAP.38.L113 ↗
10. 10.1063/1.36234910.1063/1.362349 ↗
11. 10.1016/S0022-0248(98)80126-710.1016/S0022-0248(98)80126-7 ↗
12. 10.1063/1.12701510.1063/1.127015 ↗
13. Nitayama · Jpn. J. Appl. Phys. · 1989 · 19
14. 10.2109/jcersj.97.121910.2109/jcersj.97.1219 ↗
15. 10.2109/jcersj.97.121110.2109/jcersj.97.1211 ↗
16. Ohashi · J. Korean Phys. Soc. · 1999 · 35
17. 10.1063/1.33164710.1063/1.331647 ↗
18. 10.1103/PhysRevB.33.395210.1103/PhysRevB.33.3952 ↗
19. 10.1016/0378-5963(78)90035-110.1016/0378-5963(78)90035-1 ↗
20. 10.1063/1.32654910.1063/1.326549 ↗
21. 10.1143/JJAP.16.136110.1143/JJAP.16.1361 ↗
22. 10.1063/1.33991910.1063/1.339919 ↗
23. 10.1063/1.33485810.1063/1.334858 ↗
24. 10.1143/JJAP.10.73610.1143/JJAP.10.736 ↗
25. 10.1006/jssc.1993.119110.1006/jssc.1993.1191 ↗
26. 10.1143/JJAP.38.502810.1143/JJAP.38.5028 ↗
27. 10.4028/www.scientific.net/KEM.157-158.22110.4028/www.scientific.net/KEM.157-158.221 ↗
28. 10.2109/jcersj.106.91410.2109/jcersj.106.914 ↗
29. 10.2109/jcersj.102.30510.2109/jcersj.102.305 ↗
30. 10.4028/www.scientific.net/KEM.157-158.24110.4028/www.scientific.net/KEM.157-158.241 ↗
31. 10.1063/1.32619110.1063/1.326191 ↗
32. 10.1063/1.170295210.1063/1.1702952 ↗
33. 10.2116/bunsekikagaku.47.102110.2116/bunsekikagaku.47.1021 ↗
34. 10.1016/0038-1098(96)00340-710.1016/0038-1098(96)00340-7 ↗
35. 10.1063/1.32633410.1063/1.326334 ↗
36. 17. Sukkar M.H. and Tuller H.L. , in Advance in Ceramics, ed. Yan M.F. and Heuer A.H. (American Ceramics Society, OH, 1980).
37. Nielsen · J. Am. Ceram. Soc. · 1960 · 64 · 1762
38. 10.1063/1.33750410.1063/1.337504 ↗
39. 10.1143/JJAP.19.L33510.1143/JJAP.19.L335 ↗
40. 10.1088/0268-1242/5/2/00110.1088/0268-1242/5/2/001 ↗
41. 36. Ohashi N. (unpublished).