journal article·2005-11

Phase Equilibria in the Sn-Rich Corner of the Sn–Cu–Ni Ternary Alloy System at 240 °C

Chia-Ying Li, Jenq-Gong Duh

Journal of Materials Research· Volume 20· Issue 11
Publisher page

Abstract

The interfacial reactions between solders and under bump metallization (UBM) have been of great interest recently in flip chip technology. Intermetallic compounds (IMCs), i.e., (Cu,Ni)6Sn5 and (Ni,Cu)3Sn4, usually formed between solders and UBM. To fully understand the interfacial reactions and phase transformation phenomenon, a suitable phase diagram concerning solders, IMCs, and UBM materials is required. In particular, a Sn-rich phase region in the Sn–Cu–Ni ternary diagram is very critical in determining the concentration tendency of x and y values in (Ni1−x,Cux)3Sn4 and (Cu1−y,Niy)6Sn5 compounds. In this study, ternary Sn–Cu–Ni alloys were prepared and annealed at 240 °C. Three equilibrium phases, Sn, Ni3Sn4, and Cu6Sn5, were identified by x-ray diffraction analysis and also showed in backscattered electron imaging. Using electron probe microanalysis quantitative analysis, three acme compositions of the ternary region in the Sn–Cu–Ni isotherm near the Sn-rich corner were determined as 98.5 at.% Sn, (Ni0.80, Cu0.20)3Sn4 and (Cu0.59,Ni0.41)6Sn5. In addition, the solubility of Cu and Ni in (Ni,Cu)3Sn4 and (Cu,Ni)6Sn5 compounds was evaluated. Finally, the isothermal section of the ternary Sn–Cu–Ni system at 240 °C was proposed on the basis of experimental results in this study.
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Research context

OpenAlex topics: Electronic Packaging and Soldering Technologies · 3D IC and TSV technologies · Intermetallics and Advanced Alloy Properties

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (25)

Show source-provided references
1. 10.1007/978-1-4615-0215-9_910.1007/978-1-4615-0215-9_9 ↗
2. 10.1557/JMR.2003.012810.1557/JMR.2003.0128 ↗
3. 10.1007/s11664-002-0014-x10.1007/s11664-002-0014-x ↗
4. 10.1007/s11664-003-0241-910.1007/s11664-003-0241-9 ↗
5. 10.1016/S1359-6454(00)00165-810.1016/S1359-6454(00)00165-8 ↗
6. 10.1016/S1044-5803(98)00059-X10.1016/S1044-5803(98)00059-X ↗
7. Interfacial morphology and concentration profile in the unleaded solder/Cu joint assembly.
8. 10.1016/S0927-796X(02)00007-410.1016/S0927-796X(02)00007-4 ↗
9. 10.1007/BF0322237610.1007/BF03222376 ↗
10. Harper · 2000
11. 10.1063/1.11601310.1063/1.116013 ↗
12. 10.1109/101.66659110.1109/101.666591 ↗
13. Lau · 1996 · 26
14. 10.1007/s11664-003-0012-710.1007/s11664-003-0012-7 ↗
15. 10.1007/s11664-001-0075-210.1007/s11664-001-0075-2 ↗
16. 10.1007/s11664-001-0156-210.1007/s11664-001-0156-2 ↗
17. 10.1063/1.36372810.1063/1.363728 ↗
18. Manufacturing of Cu/electroless nickel/Sn–Pb flip chip solder bumps.10.1109/6040.803448 ↗
19. 10.1007/s11664-004-0113-y10.1007/s11664-004-0113-y ↗
20. 10.1007/BF0265136810.1007/BF02651368 ↗
21. 10.1007/BF0265991210.1007/BF02659912 ↗
22. 10.1557/JMR.2002.004210.1557/JMR.2002.0042 ↗
23. 10.1109/TEPM.2002.80164810.1109/TEPM.2002.801648 ↗
24. 10.1007/s11664-002-0182-810.1007/s11664-002-0182-8 ↗
25. 10.1016/S0927-796X(00)00010-310.1016/S0927-796X(00)00010-3 ↗