Microwave dielectric properties and vibrational spectroscopic analysis of MgTe₂O₅ ceramics

MgTe₂O₅ ceramics were prepared by solid-state route. These materials were sintered in the temperature range of 640–720 °C. The structure and microstructure of the compound was investigated using x-ray diffraction (XRD), Fourier transform infrared (FTIR), Raman spectroscopy, and scanning electron microscopy (SEM) techniques. The dielectric properties of the ceramics were studied in the frequency range 4–6 GHz. The MgTe₂O₅ ceramics have a dielectric constant (ϵ_r) of 10.5, quality factors (Q_u × f) of 61000 at 5.3 GHz, and temperature coefficient of resonant frequency (τ_f) of −45 ppm/°C at the optimized sintering temperature of 700 °C. The microwave dielectric properties of these materials at cryogenic temperatures were also investigated.