journal article·2015-05-14

Characterization of irradiation defect structures and densities by transmission electron microscopy

Marquis Kirk, Xiaoou Yi, Michael Jenkins

Journal of Materials Research· Volume 30· Issue 9
Publisher page

Abstract

We describe aspects of transmission electron microscopy (TEM) technique to image and quantify the defect state following neutron or ion irradiation with an emphasis on experimental considerations. After outlining various neutron and ion irradiation scenarios, including some sample preparation suggestions, we discuss methods to measure defect densities, size distributions, structures, and interstitial or vacancy nature. The importance of the image simulations of Zhou is suggested for guidance to the most accurate quantification of the defect state. It is hoped that the usefulness of the present paper will be greatest for those experiments that compare defect states in materials after different irradiation conditions, or especially those studies designed to benchmark advanced computer model simulations of defect production and evolution. The successful simulation of the defect state in bulk samples neutron irradiated to high dose at high temperature is a goal to which the suggestions in this paper can contribute.
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Research context

OpenAlex topics: Fusion materials and technologies · Integrated Circuits and Semiconductor Failure Analysis · Ion-surface interactions and analysis

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