DataVXJournal of Materials ResearchPaper
journal article·2011-08-14

Development of a Seebeck coefficient Standard Reference Material™

Nathan D. Lowhorn, Winnie Wong-Ng, Zhan-Qian Lu, Joshua Martin, Martin L. Green, John E. Bonevich, Evan L. Thomas, Neil R. Dilley, Jeff Sharp

Journal of Materials Research· Volume 26· Issue 15
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Source abstract

Abstract

We have successfully developed a Seebeck coefficient Standard Reference Material (SRM™), Bi2Te3, that is essential for interlaboratory data comparison and for instrument calibration. Certification measurements were performed using a differential steady-state technique on 10 samples (15 measurements) randomly selected from a batch of 390 bars. The certified Seebeck coefficient values are provided from 10 to 390 K, and they are further supported by transient measurements. The availability of this SRM will validate measurement results, leading to a better understanding of the structure/property relationships and underlying physics of potential high-efficiency thermoelectric materials.
Source: expertdata · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: Advanced Thermoelectric Materials and Devices · Transition Metal Oxide Nanomaterials · Thermal Expansion and Ionic Conductivity

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

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