Improving tensile and fatigue properties of Sn–58Bi/Cu solder joints through alloying substrate
Source abstract
Abstract
To eliminate the Bi segregation and interfacial embrittlement of the SnBi/Cu joints, we deliberately added some Ag or Zn elements into the Cu substrate. Then, the reliability of the SnBi/Cu–X (X = Ag or Zn) solder joints was evaluated by investigating their interfacial reactions, tensile property, and fatigue life compared with those of the SnBi/Cu and SnAg/Cu joints. The experimental results demonstrate that even after aging for a long time, the addition of the Ag or Zn elements into the Cu substrate can effectively eliminate the interfacial Bi embrittlement of the SnBi/Cu–X joints under tensile or fatigue loadings. Compared with the conventional SnAg/Cu joints, the SnBi/Cu–X joints exhibit higher adhesive strength and comparable fatigue resistance. Finally, the fatigue and fracture mechanisms of the SnBi/Cu–X solder joints were discussed qualitatively. The current findings may pave the new way for the Sn–Bi solder widely used in the electronic interconnection in the future.
Source: crossref · Quality: baseline
Research context
OpenAlex topics: Electronic Packaging and Soldering Technologies · Advanced Welding Techniques Analysis · 3D IC and TSV technologies
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (30)
Show source-provided references
1. Low-temperature soldering.
2. Tojima · 1999
3. 10.1016/S0921-5093(03)00277-610.1016/S0921-5093(03)00277-6 ↗
4. 10.1016/j.scriptamat.2009.04.00910.1016/j.scriptamat.2009.04.009 ↗
5. 10.1557/JMR.2008.001510.1557/JMR.2008.0015 ↗
6. 10.1557/jmr.2006.019810.1557/jmr.2006.0198 ↗
7. 10.1557/JMR.2008.021410.1557/JMR.2008.0214 ↗
8. Liquids of Ag–Cu–Bi system.
9. 10.1557/jmr.2006.039010.1557/jmr.2006.0390 ↗
10. 10.1016/S0927-796X(00)00010-310.1016/S0927-796X(00)00010-3 ↗
11. 10.1007/BF0265542710.1007/BF02655427 ↗
12. 10.1007/BF0265136110.1007/BF02651361 ↗
13. Mei · 1997 · 463
14. 10.1557/JMR.2001.022910.1557/JMR.2001.0229 ↗
15. 10.1557/JMR.2005.011510.1557/JMR.2005.0115 ↗
16. Yamagishi · 1996 · 252
17. 10.1016/j.actamat.2007.05.03410.1016/j.actamat.2007.05.034 ↗
18. 10.1038/nmat119110.1038/nmat1191 ↗
19. 10.1007/s11664-003-0108-010.1007/s11664-003-0108-0 ↗
20. 10.1016/j.actamat.2003.12.04210.1016/j.actamat.2003.12.042 ↗
21. Zou · Mater. Sci. Eng., A · 2010
22. 10.1007/s11664-009-0894-010.1007/s11664-009-0894-0 ↗
23. 10.1016/j.jallcom.2009.06.10810.1016/j.jallcom.2009.06.108 ↗
24. Fatigue fracture mechanisms of Cu/lead-free solders interfaces.
25. 10.1007/BF0265136210.1007/BF02651362 ↗
26. 10.1016/j.scriptamat.2007.10.02510.1016/j.scriptamat.2007.10.025 ↗
27. 10.1007/BF0113241310.1007/BF01132413 ↗
28. 10.1038/nature0319810.1038/nature03198 ↗
29. 10.1016/S1359-6462(01)00670-410.1016/S1359-6462(01)00670-4 ↗
30. 26. Zhang Q.K. , Zhang Z.F. unpublished work