journal article·2004-11-01

Critical evaluation of the Lotgering degree of orientation texture indicator

Jacob L. Jones, Elliott B. Slamovich, Keith J. Bowman

Journal of Materials Research· Volume 19· Issue 11
Publisher page

Abstract

Preferred orientation in textured ceramics is often assessed by comparing the relative intensities of x-ray diffraction reflections to those of a randomly oriented ceramic using the Lotgering degree of orientation (f). However, this paper provides evidence that indiscriminate assessments of f can be misleading. Using measured intensities of a modestly textured tape cast bismuth titanate (Na0.5Bi4.5Ti4O15) ceramic, calculated f values vary from 7.4 to 73.2% depending on the reflections included in the calculation. The texture is also quantified by calculating the orientation distribution function (ODF) using measured pole figures. A model is then presented that demonstrates f is nonlinear with the multiple of preferred (00l)-orientations, the standard unit of the 00l pole figure.
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Research context

OpenAlex topics: X-ray Diffraction in Crystallography · Nuclear materials and radiation effects · Ferroelectric and Piezoelectric Materials

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