journal article·1999-04

Thin Film Microstructure Control Using Glancing Angle Deposition by Sputtering

J. C. Sit, D. Vick, K. Robbie, M. J. Brett

Journal of Materials Research· Volume 14· Issue 4
Publisher page

Abstract

Thin films with microstructures controlled on a nanometer scale have been fabricated using a recently developed process called glancing angle deposition (GLAD) which combines oblique angle evaporation with controlled substrate motion. Critical to the production of GLAD thin films is the requirement for a narrow angular flux distribution centered at an oblique incidence angle. We report here recent work with low-pressure, long-throw sputter deposition with which we have succeeded in fabricating porous titanium thin films possessing “zig-zag,” helical, and “pillar” microstructures, demonstrating microstructural control on a level consistent with evaporated GLAD. The use of sputtering for GLAD simplifies process control and should enable deposition of a broader range of thin film materials.
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Research context

OpenAlex topics: Optical Coatings and Gratings · High-Temperature Coating Behaviors · Metal and Thin Film Mechanics

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

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