journal article·2006-10

Structural characterization of a new layered-ternary Ta4AlC3 ceramic

Z.J. Lin, M.J. Zhuo, Y.C. Zhou, M.S. Li, J.Y. Wang

Journal of Materials Research· Volume 21· Issue 10
Publisher page

Abstract

Bulk Ta4AlC3, a new layered-ternary carbide in the Ta–Al–C system, was synthesized and characterized. Transmission electron microscopy investigations on this new phase are reported here. Selected area electron diffraction and convergent beam electron diffraction analyses indicated that this ternary carbide crystallized with the space group P63/mmc. Atomic-scale microstructures of Ta4AlC3 were achieved by means of high-resolution transmission electron microscopy and Z-contrast scanning transmission electron microscopy. The experimental crystal structural parameters agreed well with the theoretical values obtained using density-functional calculations.
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Research context

OpenAlex topics: MXene and MAX Phase Materials · Aluminum Alloys Composites Properties · Advanced ceramic materials synthesis

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