journal article·1988-10

The cracking and decohesion of thin films

A. G. Evans, M. D. Drory, M. S. Hu

Journal of Materials Research· Volume 3· Issue 5
Publisher page

Abstract

The cracking and decohesion of thin films can be characterized by critical values of a nondimensional parameter governed by the residual stress, the film thickness, and a fracture resistance. This article reviews the status of understanding concerning the magnitude of this number for various types of adherent film on either brittle or ductile substrates. Important effects of elastic properties, substrate thickness, and yield strength are described.
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Research context

OpenAlex topics: Numerical methods in engineering · Geotechnical Engineering and Underground Structures · Non-Destructive Testing Techniques

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References (13)

Show source-provided references
1. 10.1111/j.1151-2916.1986.tb04718.x10.1111/j.1151-2916.1986.tb04718.x ↗
2. 10.1063/1.33379510.1063/1.333795 ↗
3. 9 Ho P. (private communication).
4. 8 Suo Z. and Hutchinson J. W. , Harvard Applied Sciences Report, MECH 118 (1988).
5. 10.1016/0040-6090(86)90301-910.1016/0040-6090(86)90301-9 ↗
6. 7 Drory M. D. , Thouless M. D. , and Evans A. G. , Acta Metall. (in press).
7. 10.1557/PROC-54-79910.1557/PROC-54-799 ↗
8. 10 Hu M. S. and Evans A. G. , Acta Metall. (to be published).
9. Evans · Intl. J. Solids Struct. · 1981 · 20 · 451
10. 10.1016/0001-6160(87)90015-010.1016/0001-6160(87)90015-0 ↗
11. Hoffman · Phys. Thin Films · 1966 · 3 · 211
12. 10.1016/0001-6160(88)90282-910.1016/0001-6160(88)90282-9 ↗
13. 12 Charalambides P. G. , Lund J. , McMeeking R. M. , and Evans A. G. , J. Appl. Mech. (in press).