Atomic layer etching of metal–polar aluminum nitride and gallium nitride using SF 6 and Cl 2 /BCl 3 plasma
Abstract
Research context
OpenAlex topics: GaN-based semiconductor devices and materials · Plasma Diagnostics and Applications · Acoustic Wave Resonator Technologies
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Affiliations
Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853, USA
Department of Materials Science and Engineering, University of Colorado, Boulder, Colorado 80303, USA
School of Electrical and Computer Engineering, Cornell University, Ithaca, New York 14853, USA
School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853, USA
Cornell NanoScale Science and Technology Facility, Cornell University, Ithaca, New York 14853, USA
Kavli Institute at Cornell for Nanoscale Science, Cornell University, Ithaca, New York 14853, USA
Department of Chemistry, University of Colorado, Boulder, Colorado 80309-0215, USA
Funding
Semiconductor Research Corporation · Army Research Office · Defense Sciences Office, DARPA · National Science Foundation