journal article·2026

Atomic layer etching of metal–polar aluminum nitride and gallium nitride using SF 6 and Cl 2 /BCl 3 plasma

Rafael Panagiotopoulos, Michael Collings, Pierce Lonergan, Joseph E. Dill, Jeremy Clark, Debdeep Jena, Steven M. George, Huili Grace Xing

Publisher page

Abstract

We report atomic layer etching of metal–polar AlN and GaN with SF 6 and Cl 2 /BCl 3 plasmas. Etch rates of 1 unit cell per cycle and synergy >97% is achieved at temperatures at or below 100 °C.
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

OpenAlex topics: GaN-based semiconductor devices and materials · Plasma Diagnostics and Applications · Acoustic Wave Resonator Technologies

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853, USA

Department of Materials Science and Engineering, University of Colorado, Boulder, Colorado 80303, USA

School of Electrical and Computer Engineering, Cornell University, Ithaca, New York 14853, USA

School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853, USA

Cornell NanoScale Science and Technology Facility, Cornell University, Ithaca, New York 14853, USA

Kavli Institute at Cornell for Nanoscale Science, Cornell University, Ithaca, New York 14853, USA

Department of Chemistry, University of Colorado, Boulder, Colorado 80309-0215, USA

Funding

Semiconductor Research Corporation · Army Research Office · Defense Sciences Office, DARPA · National Science Foundation

References (50)

Show source-provided references
1. Mishra · Proc. IEEE · 2002 · 90 · 102210.1109/JPROC.2002.1021567 ↗
2. Jones · IEEE J. Emerg. Sel. Top. Power Electron. · 2016 · 4 · 70710.1109/JESTPE.2016.2582685 ↗
3. Hickman · Semicond. Sci. Technol. · 2021 · 36 · 04400110.1088/1361-6641/abe5fd ↗
4. Kim · Adv. Electron. Mater. · 2026 · 12 · e0039310.1002/aelm.202500393 ↗
5. Amano · J. Phys. D: Appl. Phys. · 2020 · 53 · 50300110.1088/1361-6463/aba64c ↗
6. Agrawal · AIP Adv. · 2026 · 16 · 03532210.1063/5.0313357 ↗
7. Xiong · New J. Phys. · 2012 · 14 · 09501410.1088/1367-2630/14/9/095014 ↗
8. Nakamura · Proc. IEEE · 2013 · 101 · 221110.1109/JPROC.2013.2274929 ↗
9. Imada · The 2010 International Power Electronics Conference - ECCE ASIA - · 2010 · 102710.1109/IPEC.2010.5542039 ↗
10. Then · IEEE Microw. Wirel. Technol. Lett. · 2023 · 33 · 83510.1109/LMWT.2023.3268184 ↗
11. Hung · IEEE Electron Device Lett. · 2014 · 35 · 31210.1109/LED.2013.2296659 ↗
12. Lee · IEEE J. Electron Devices Soc. · 2023 · 11 · 16710.1109/JEDS.2023.3253137 ↗
13. Palacios · IEEE Electron Device Lett. · 2006 · 27 · 42810.1109/LED.2006.874761 ↗
14. Yang · IEEE Electron Device Lett. · 2022 · 43 · 162910.1109/LED.2022.3201900 ↗
15. Miersch · J. Vac. Sci. Technol., A · 2024 · 42 · 02260410.1116/6.0003350 ↗
16. Lu · Nano Lett. · 2019 · 19 · 515910.1021/acs.nanolett.9b01525 ↗
17. Edel · J. Vac. Sci. Technol., A · 2024 · 42 · 06260210.1116/6.0003899 ↗
18. Liu · Opt. Lett. · 2025 · 50 · 375610.1364/OL.561706 ↗
19. Kanarik · J. Vac. Sci. Technol., A · 2015 · 33 · 02080210.1116/1.4913379 ↗
20. Kanarik · J. Phys. Chem. Lett. · 2018 · 9 · 481410.1021/acs.jpclett.8b00997 ↗
21. Kanarik · J. Vac. Sci. Technol., A · 2017 · 35 · 05C30210.1116/1.4979019 ↗
22. Ruel · J. Vac. Sci. Technol., A · 2021 · 39 · 02260110.1116/6.0000830 ↗
23. Miersch · J. Vac. Sci. Technol., A · 2024 · 42 · 02260410.1116/6.0003350 ↗
24. Burnham · Phys. Status Solidi C · 2010 · 7 · 201210.1002/pssc.200983644 ↗
25. Guan · J. Semicond. · 2022 · 43 · 11310110.1088/1674-4926/43/11/113101 ↗
26. Edel · J. Vac. Sci. Technol., A · 2024 · 42 · 06260210.1116/6.0003899 ↗
27. Fischer · J. Vac. Sci. Technol., A · 2021 · 39 · 03080110.1116/6.0000894 ↗
28. George · Acc. Chem. Res. · 2020 · 53 · 115110.1021/acs.accounts.0c00084 ↗
29. Johnson · Appl. Phys. Lett. · 2019 · 114 · 24310310.1063/1.5095938 ↗
30. Cano · J. Phys. Chem. C · 2022 · 126 · 699010.1021/acs.jpcc.1c10972 ↗
31. Wang · J. Vac. Sci. Technol., A · 2023 · 41 · 03260610.1116/6.0002476 ↗
32. Chittock · J. Appl. Phys. · 2023 · 134 · 07530210.1063/5.0158129 ↗
33. Rahman · IEEE Trans. Semicond. Manuf. · 2021 · 34 · 50010.1109/TSM.2021.3112502 ↗
34. Peeters · Appl. Phys. Lett. · 2023 · 123 · 13260310.1063/5.0169339 ↗
35. Brunetti · J. Chem. Eng. Data · 2009 · 54 · 94010.1021/je8007167 ↗
36. Brunetti · J. Chem. Eng. Data · 2010 · 55 · 9810.1021/je900276q ↗
37. Gerritsen · ACS Appl. Nano Mater. · 2022 · 5 · 1811610.1021/acsanm.2c04025 ↗
38. Grey · Appl. Surf. Sci. · 2024 · 653 · 15931910.1016/j.apsusc.2024.159319 ↗
39. Edgar · J. Cryst. Grow. · 2008 · 310 · 400210.1016/j.jcrysgro.2008.06.014 ↗
40. McCandless · Appl. Phys. Lett. · 2024 · 124 · 11160110.1063/5.0191280 ↗
41. Ebner · J. Solid State Chem. · 1976 · 17 · 44710.1016/S0022-4596(76)80016-3 ↗
42. J.Moulder and J.Chastain , Handbook of X-ray Photoelectron Spectroscopy: A Reference Book of Standard Spectra for Identification and Interpretation of XPS Data , Physical Electronics Division, Perkin-Elmer Corporation , 1992
43. Moldovan · Philos. Mag. · 2006 · 86 · 231510.1080/14786430500522628 ↗
44. Rosenberger · Surf. Interface Anal. · 2008 · 40 · 125410.1002/sia.2874 ↗
45. Sherwood · Surf. Sci. Spectra · 1998 · 5 · 110.1116/1.1247880 ↗
46. Ramos · Plasma Sources Sci. Technol. · 2007 · 16 · 71110.1088/0963-0252/16/4/004 ↗
47. Nagata · J. Appl. Phys. · 2025 · 137 · 09530410.1063/5.0224068 ↗
48. Rammal · MRS Adv. · 2019 · 4 · 157910.1557/adv.2019.84 ↗
49. Kim · J. Vac. Sci. Technol., A · 1999 · 17 · 221410.1116/1.581749 ↗
50. Martin · J. Vac. Sci. Technol., A · 2009 · 27 · 20910.1116/1.3065679 ↗