journal article·2026

Consistent evidence for intra- and inter-columnar transport decoupling in sputter-grown ZnSnN 2 thin films through growth-driven microstructural evolution

Juchan Hwang, Young-Ill Kim, Dohyun Kim, Jongmin Kim, Jungwook Min, Gyeong Cheol Park, Chee Leong Tan, Hyeongmun Kim, Chul Kang, Kwangwook Park

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Abstract

THz-TDS and Hall measurements reveal that transport degradation in sputter-grown ZnSnN 2 films originates from inter-columnar connectivity loss, not local column deterioration.
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

OpenAlex topics: Machine Learning in Materials Science · ZnO doping and properties · GaN-based semiconductor devices and materials

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Division of Advanced Materials Engineering, Jeonbuk National University, Jeonju 54896, Republic of Korea

Advanced Photonics Research Institute, Gwangju Institute of Science and Technology, Gwangju 61005, Republic of Korea

Device Technology Division, Korea Advanced Nano Fab Center, Suwon 16229, Republic of Korea

Department of Integrative Energy, Myongji University, Yongin 17058, Republic of Korea

Electronics and Telecommunications Research Institute, Daejeon 34129, Republic of Korea

Department of Electrical and Computer Engineering, Portland State University, Portland, OR 97201, USA

College of Integrated Circuit Science and Engineering, Nanjing University of Posts and Telecommunications, Nanjing 210023, China

Division of Electronics and Information Engineering, Jeonbuk National University, Jeonju 54896, Republic of Korea

Hydrogen and Fuel Cell Research Center, Jeonbuk National University, Jeonju 54896, Republic of Korea

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