Non-parametric statistical characterization of electrical characteristics in nanoscale conductive filament devices
Source abstract
Abstract
Nonparametric statistical analysis of 22 parameters for 174 Ag, Cu, Ni, Co, and VCM nanofilamentary devices reveals the current performance and future development trends of RRAM devices.
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short
Research context
OpenAlex topics: Quantum and electron transport phenomena · Advanced Physical and Chemical Molecular Interactions · Chemical and Physical Properties of Materials
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Beijing Matrix Differential Electronic Technology Co., Ltd., Integrated Circuit Design Division, Beijing 100011, China, 334096109@qq.com
Beijing Matrix Differential Electronic Technology Co., Ltd., Technology Division, Beijing 100011, China
Funding
National Natural Science Foundation of China
References (69)
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