journal article·2026

A stepped silicon-based detector for broad-wavelength detection from 365 to 1170 nm

Jia Liu, Zi-Yi Lou, Xin-Yue Liu, Feng-Xia Liang, Cong-Cong Wang, Jie Wang, Chun-Yan Wu, Li Wang, Xiang Zhang, Yan Wang, Can Fu, Lin-Bao Luo

Journal of Materials Chemistry C· Volume 14· Issue 11
Publisher page

Abstract

A stepped Si sensor for filter-free detection uses two Au/Si/Au photodetectors to identify wavelengths from 365–1170 nm.
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

OpenAlex topics: CCD and CMOS Imaging Sensors · Optical Polarization and Ellipsometry · Thin-Film Transistor Technologies

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

School of Microelectronics, Hefei University of Technology, Hefei, 230009, P. R. China

School of Integrated Circuits, Anhui University, Hefei, Anhui, 230601, China

Funding

Natural Science Foundation of Anhui Province · National Natural Science Foundation of China · Fundamental Research Funds for the Central Universities

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