A multi-state spectroscopic approach to carrier dynamics in thin-film topological insulators
Abstract
Research context
OpenAlex topics: Topological Materials and Phenomena · Surface and Thin Film Phenomena · Chemical and Physical Properties of Materials
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Affiliations
School of Optoelectronic Engineering and Instrumentation Science, Dalian University of Technology, Dalian 116024, China
Department of Cosmetic Surgery, Central Hospital of Dalian University of Technology, Dalian 116089, China
Department of Photonics, National Sun Yat-Sen University, Kaohsiung 80411, Taiwan
Department of Physics, National Cheng Kung University, Tainan, 70101, Taiwan
Department of Applied Physics, National University of Kaohsiung, Kaohsiung, 81148, Taiwan
Taiwan Consortium of Emergent Crystalline Materials, National Science and Technology Council, Taipei 10622, Taiwan
Department of Electrophysics, National Yang Ming Chiao Tung University, Hsinchu 30010, Taiwan
Funding
National Science and Technology Council · Fundamental Research Funds for the Central Universities