End-to-end edge detection on self-rectifying resistive memory array
Source abstract
Abstract
We fabricate the Cu 2 Te memristor with self-rectifying characteristics, and explore its application in edge detection, which is realized in a single step manner by a new Gauss–Laplace operator in a circuit with the memristor array.
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short
Research context
OpenAlex topics: Advanced Memory and Neural Computing · CCD and CMOS Imaging Sensors · Neural Networks and Applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Key Laboratory of Artificial Micro- and Nano-Structures of Ministry of Education, School of Physics and Technology, Wuhan University, Wuhan 430072, China
School of Information and Software Engineering, East China Jiaotong University, Nanchang 330013, China
School of Microelectronics, Wuhan University, Wuhan 430072, China
Funding
National Natural Science Foundation of China
References (44)
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