Correction: Space-charge accumulation and band bending at conductive P3HT/PDIF-CN 2 interfaces investigated by scanning-Kelvin probe microscopy
Source abstract
Abstract
Correction for ‘Space-charge accumulation and band bending at conductive P3HT/PDIF-CN 2 interfaces investigated by scanning-Kelvin probe microscopy’ by Federico Chianese et al. , J. Mater. Chem. C , 2021, DOI: 10.1039/d1tc04840f.
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short
Research context
OpenAlex topics: Analytical Chemistry and Sensors · Semiconductor materials and devices · Electronic and Structural Properties of Oxides
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Physics Department, Università degli studi di Napoli Federico II, Piazzale Tecchio 80, 80126 Naples, Italy
CNR-SPIN, Division of Naples, Piazzale Tecchio 80, 80126 Naples, Italy
Department of Chemical Sciences, Università degli studi di Napoli Federico II, Complesso universitario di Monte S. Angelo, Via Cintia 21, 80126 Naples, Italy
References
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