journal article·2020

Moisture resistance evaluation on single electronic package moulding compound

Cher Ming Tan, Udit Narula, Guan Ling Seow, Vivek Sangwan, Ching Hsiang Chen, Shu Ping Lin, Jia Yuan Chen

Publisher page

Abstract

Non-destructive evaluation indices that correlate with the moisture resistance of integrated circuit packages are developed.
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

OpenAlex topics: Material Properties and Processing · Electronic Packaging and Soldering Technologies · Additive Manufacturing and 3D Printing Technologies

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Center for Reliability Sciences and Technologies

Chang Gung University

Taoyuan 33302

Taiwan

Department of Electronic Engineering

Department of Physics

Faculty of Science

National University of Singapore

Singapore

CL Technology Co., Limited

New Taipei

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